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july 2003 the following document specifies spansion memory products that are now offered by both advanced micro devices and fujitsu. although the document is marked with the name of the company that orig- inally developed the specification, these products will be offered to customers of both amd and fujitsu. continuity of specifications there is no change to this datasheet as a result of offering the device as a spansion product. any changes that have been made are the result of normal datasheet improvement and are noted in the document revision summary, where supported. future routine revisions will occur when appropriate, and changes will be noted in a revision summary. continuity of ordering part numbers amd and fujitsu continue to support existing part numbers beginning with ?am? and ?mbm?. to order these products, please use only the ordering part numbers listed in this document. for more information please contact your local amd or fujitsu sales office for additional information about spansion memory solutions. am49pdl640ag data sheet publication number 30049 revision a amendment +5 issue date november 20, 2003
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preliminary this document contains information on a product under development at advanced micro devices. the information is intended to help you evaluate this product. amd reserves the right to change or discontinue work on this proposed product without notice. 11/20/03 publication# 30049 rev: a amendment/ +5 issue date: november 20, 2003 refer to amd?s website (www.amd.com) for the latest information. am49pdl640ag stacked multi-chip package (mcp) flash memory and sram 64 megabit (4 m x 16-bit) cmos 3.0 volt-only, simultaneous operation flash memory and 16 mbit (1 m x 16-bit) pseudo static ram distinctive characteristics mcp features power supply voltage of 2.7 to 3.1 volt high performance ? access time as fast as 70 ns initial/ 25 ns subsequent package ? 73-ball fbga operating temperature ? ?25c to +85c flash memory features architectural advantages simultaneous read/write operations ? data can be continuously read from one bank while executing erase/program functions in another bank. ? zero latency between read and write operations flex bank ? architecture ? 4 separate banks, with up to two simultaneous operations per device ? bank a: 8 mbit (4 kw x 8 and 32kw x 15) ? bank b: 24 mbit (32 kw x 48) ? bank c: 24 mbit (32 kw x 48) ? bank d: 8 mbit (4 kw x 8 and 32 kw x 15) manufactured on 0.17 m process technology secsi? (secured silicon) sector: extra 256 byte sector ? factory locked and identifiable: 16 bytes available for secure, random factory electronic serial number; verifiable as factory locked through autoselect function. expressflash option allows entire sector to be available for factory-secured data ? customer lockable: sector is one-time programmable. once sector is locked, data cannot be changed. zero power operation ? sophisticated power management circuits reduce power consumed during inactive periods to nearly zero. boot sectors ? top and bottom boot sectors in the same device compatible with jedec standards ? pinout and software compatible with single-power-supply flash standard performance characteristics high performance ? access time as fast as 70 ns ? program time: 4 s/word typical utilizing accelerate function ultra low power consumption (typical values) ? 23 ma active read current ? 15 ma program/erase current ? 200 na in standby or automatic sleep mode minimum 1 million write cycles guaranteed per sector 20 year data retention at 125 c ? reliable operation for the life of the system software features software command-set compatible with jedec 42.4 standard ? backward compatible with am29f and am29lv families cfi (common flash interface) complaint ? provides device-specific information to the system, allowing host software to easily reconfigure for different flash devices erase suspend / erase resume ? suspends an erase operation to allow read or program operations in other sectors of same bank unlock bypass program command ? reduces overall programming time when issuing multiple program command sequences hardware features any combination of sectors can be erased ready/busy# output (ry/by#) ? hardware method for detecting program or erase cycle completion hardware reset pin (reset#) ? hardware method of resetting the internal state machine to the read mode wp#/acc input pin ? write protect (wp#) function protects sectors 0, 1, 140, and 141, regardless of sector protect status ? acceleration (acc) function accelerates program timing persistent sector protection ? a command sector protection method to lock combinations of individual sectors and sector groups to prevent program or erase operations within that sector ? sectors can be locked and unlocked in-system at v cc level password sector protection ? a sophisticated sector protection method to lock combinations of individual sectors and sector groups to prevent program or erase operations within that sector using a user-defined 64-bit password pseudo sram features power dissipation ? operating: 30 ma maximum ? standby: 100 a maximum ? deep power-down current: 10 a ce1s# and ce2s chip select power down features using ce1s# and ce2s data retention supply voltage: 2.7 to 3.1 volt byte data control: lb#s (dq7?dq0), ub#s (dq15?dq8) multiple psram vendors available
2 am49pdl640ag november 20, 2003 preliminary general description am29pdl640g features the am29pdl640g is a 64 mbit, 3.0 volt-only page mode and simultaneous read/write flash memory device orga- nized as 4 mwords. the device is offered in 73-ball fine-pitch bga packages. the word-wide data (x16) ap- pears on dq15-dq0. this device can be programmed in-system or in standard eprom programmers. a 12.0 v v pp is not required for write or erase operations. the device offers fast page access times of 25, 30, and 45 ns, with corresponding random access times of 65, 70, 85, and 90 ns, respectively, allowing high speed microproces- sors to operate without wait states. to eliminate bus conten- tion the device has separate chip enable (ce#), write enable (we#) and output enable (oe#) controls. simultaneous read/write operation with zero latency the simultaneous read/write architecture provides simul- taneous operation by dividing the memory space into 4 banks, which can be considered to be four separate memory arrays as far as certain operations are concerned. the de- vice can improve overall system performance by allowing a host system to program or erase in one bank, then immedi- ately and simultaneously read from another bank with zero latency (with two simultaneous operations operating at any one time). this releases the system from waiting for the completion of a program or erase operation, greatly improv- ing system performance. the device can be organized in both top and bottom sector configurations. the banks are organized as follows: page mode features the device is ac timing, input/output, and package compat- ible with 4 mbit x16 page mode mask rom . the page size is 8 words. after initial page access is accomplished, the page mode op- eration provides fast read access speed of random locations within that page. standard flash memory features the device requires a single 3.0 volt power supply (2.7 v to 3.1 v) for both read and write functions. internally gener- ated and regulated voltages are provided for the program and erase operations. the device is entirely command set compatible with the jedec 42.4 single-power-supply flash standard . com- mands are written to the command register using standard microprocessor write timing. register contents serve as in- puts to an internal state-machine that controls the erase and programming circuitry. write cycles also internally latch ad- dresses and data needed for the programming and erase operations. reading data out of the device is similar to read- ing from other flash or eprom devices. device programming occurs by executing the program com- mand sequence. the unlock bypass mode facilitates faster programming times by requiring only two write cycles to pro- gram data instead of four. device erasure occurs by execut- ing the erase command sequence. the host system can detect whether a program or erase op- eration is complete by reading the dq7 (data# polling) and dq6 (toggle) status bits . after a program or erase cycle has been completed, the device is ready to read array data or ac- cept another command. the sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data con- tents of other sectors. the device is fully erased when shipped from the factory. hardware data protection measures include a low v cc de- tector that automatically inhibits write operations during power transitions. the hardware sector protection feature disables both program and erase operations in any combina- tion of sectors of memory. this can be achieved in-system or via programming equipment. the erase suspend/erase resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. true background erase can thus be achieved. if a read is needed from the secsi sector area (one time pro- gram area) after an erase suspend, then the user must use the proper command sequence to enter and exit this region. the device offers two power-saving features. when ad- dresses have been stable for a specified amount of time, the device enters the automatic sleep mode . the system can also place the device into the standby mode. power con- sumption is greatly reduced in both these modes. amd?s flash technology combined years of flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. the device electri- cally erases all bits within a sector simultaneously via fowler-nordheim tunneling. the data is programmed using hot electron injection. bank sectors a 8 mbit (4 kw x 8 and 32 kw x 15) b 24 mbit (32 kw x 48) c 24 mbit (32 kw x 48) d 8 mbit (4 kw x 8 and 32 kw x 15)
november 20, 2003 am49pdl640ag 3 preliminary table of contents product selector guide . . . . . . . . . . . . . . . . . . . . . 5 mcp block diagram . . . . . . . . . . . . . . . . . . . . . . . . 5 flash memory block diagram . . . . . . . . . . . . . . . . 6 psram block diagram . . . . . . . . . . . . . . . . . . . . . 6 connection diagram . . . . . . . . . . . . . . . . . . . . . . . . 7 special package handling instructions .................................... 7 ordering information . . . . . . . . . . . . . . . . . . . . . . . 9 mcp device bus operations . . . . . . . . . . . . . . . . . 9 random read (non-page read) ........................................ 11 page mode read ................................................................ 11 table 2. page select .......................................................................11 simultaneous operation ......................................................... 11 table 3. bank select .......................................................................11 writing commands/command sequences ............................ 11 accelerated program operation .......................................... 12 autoselect functions ........................................................... 12 automatic sleep mode ........................................................... 12 reset#: hardware reset pin ............................................... 12 output disable mode .............................................................. 13 table 4. am29pdl640g sector architecture .................................13 table 5. bank address ....................................................................14 table 6. secsi tm sectorsecure sector addresses .........................14 table 7. am29pdl640g boot sector/sector block addresses for pro- tection/unprotection ........................................................................15 sector protection . . . . . . . . . . . . . . . . . . . . . . . . . 16 persistent sector protection ................................................... 16 persistent protection bit (ppb) ............................................ 16 persistent protection bit lock (ppb lock) .......................... 16 dynamic protection bit (dyb) ............................................. 16 table 8. sector protection schemes ...............................................17 persistent sector protection mode locking bit ................... 17 password protection mode ..................................................... 17 password and password mode locking bit ........................ 18 64-bit password ................................................................... 18 write protect (wp#) ................................................................ 18 persistent protection bit lock .............................................. 18 high voltage sector protection .............................................. 19 figure 1. in-system sector protection/ sector unprotection algorithms ...................................................... 20 temporary sector unprotect .................................................. 21 figure 2. temporary sector unprotect operation........................... 21 secsi? (secured silicon) sector sectorflash memory region ................................................. 21 secsi sector protection bit ................................................. 22 figure 3. secsi sector protect verify.............................................. 22 hardware data protection ...................................................... 23 low vcc write inhibit ......................................................... 23 write pulse ?glitch? protection ............................................ 23 logical inhibit ...................................................................... 23 power-up write inhibit ......................................................... 23 common flash memory interface (cfi) . . . . . . . 23 command definitions . . . . . . . . . . . . . . . . . . . . . . 27 reading array data ................................................................ 27 reset command ..................................................................... 27 autoselect command sequence ............................................ 27 enter secsi? sector/exit secsi sector command sequence .............................................................. 28 word program command sequence ...................................... 28 unlock bypass command sequence .................................. 28 figure 4. program operation ......................................................... 29 chip erase command sequence ........................................... 29 sector erase command sequence ........................................ 29 erase suspend/erase resume commands ........................... 30 figure 5. erase operation.............................................................. 30 password program command ................................................ 30 password verify command .................................................... 31 password protection mode locking bit program command .. 31 persistent sector protection mode locking bit program com- mand ....................................................................................... 31 secsi sector protection bit program command .................... 31 ppb lock bit set command ................................................... 31 dyb write command ............................................................. 31 password unlock command .................................................. 32 ppb program command ........................................................ 32 all ppb erase command ........................................................ 32 dyb write command ............................................................. 32 ppb lock bit set command ................................................... 32 ppb status command ............................................................ 32 ppb lock bit status command .............................................. 32 sector protection status command ....................................... 32 table 13. memory array command definitions ............................. 33 table 14. sector protection command definitions ........................ 34 write operation status . . . . . . . . . . . . . . . . . . . . 35 dq7: data# polling ................................................................. 35 figure 6. data# polling algorithm .................................................. 35 dq6: toggle bit i .................................................................... 36 figure 7. toggle bit algorithm........................................................ 36 dq2: toggle bit ii ................................................................... 37 reading toggle bits dq6/dq2 ............................................... 37 dq5: exceeded timing limits ................................................ 37 dq3: sector erase timer ....................................................... 37 table 15. write operation status ................................................... 38 psram power down . . . . . . . . . . . . . . . . . . . . . . 39 figure 8. state diagram ................................................................. 39 table 16. standby mode characteristics ....................................... 39 absolute maximum ratings . . . . . . . . . . . . . . . . 40 figure 9. maximum negative overshoot waveform ...................... 40 figure 10. maximum positive overshoot waveform...................... 40 dc characteristics . . . . . . . . . . . . . . . . . . . . . . . . 41 test conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 43 figure 11. test setup.................................................................... 43 figure 12. input waveforms and measurement levels ................. 43 ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . 44 psram ce#s timing .............................................................. 44 figure 13. timing diagram for alternating between psram to flash .............................................................. 44 read-only operations ........................................................... 45 figure 14. read operation timings ............................................... 45 figure 15. page read operation timings...................................... 46 hardware reset (reset#) .................................................... 47 figure 16. reset timings ............................................................... 47 erase and program operations .............................................. 48 figure 17. program operation timings.......................................... 49 figure 18. accelerated program timing diagram .......................... 49 figure 19. chip/sector erase operation timings .......................... 50
4 am49pdl640ag november 20, 2003 preliminary figure 20. back-to-back read/write cycle timings ....................... 51 figure 21. data# polling timings (during embedded algorithms).. 51 figure 22. toggle bit timings (during embedded algorithms)....... 52 figure 23. dq2 vs. dq6.................................................................. 52 temporary sector unprotect .................................................. 53 figure 24. temporary sector unprotect timing diagram ............... 53 figure 25. sector/sector block protect and unprotect timing diagram .............................................................. 54 alternate ce#f controlled erase and program operations .... 55 figure 26. flash alternate ce#f controlled write (erase/program) operation timings........................................................................... 56 power up time ....................................................................... 57 figure 27. power up ....................................................................... 57 figure 28. vccs slew rate............................................................ 57 read cycle ............................................................................. 58 read cycle ............................................................................. 59 figure 29. psram read cycle?address controlled ...................... 59 figure 30. psram read cycle?cs1# controlled........................... 59 write cycle ............................................................................. 60 figure 31. psram write cycle?we# controlled ........................... 61 figure 32. psram write cycle?cs1# controlled.......................... 61 figure 33. psram write cycle?ub#, lb# controlled ................... 62 figure 34. deep power down mode .............................................. 62 figure 35. abnormal timing........................................................... 63 figure 36. avoidable timing 1 ....................................................... 63 figure 37. avoidable timing 2 ....................................................... 63 erase and programming performance . . . . . . . 64 latchup characteristics . . . . . . . . . . . . . . . . . . . . 64 package pin capacitance. . . . . . . . . . . . . . . . . . . 64 flash data retention . . . . . . . . . . . . . . . . . . . . . . 64 physical dimensions . . . . . . . . . . . . . . . . . . . . . . 65 flk073?73-ball fine-pitch grid array 13 x 9 mm ................ 65 revision summary . . . . . . . . . . . . . . . . . . . . . . . . 66
november 20, 2003 am49pdl640ag 5 preliminary product selector guide mcp block diagram part number am49pdl640ag speed options standard voltage range: v cc = 2.7?3.1 v flash memory pseudo sram 70 85 70 85 max access time (ns) t acc 70 85 70 85 max page access (ns) t pa c c 25 30 n/a n/a ce#f access (ns) t ce 70 85 70 85 oe# access (ns) t oe 25 30 35 40 v ss /v ssq v cc s/v ccq reset# we# ce#f oe# ce1#s v ss v cc f ry/by# lb#s ub#s wp#/acc ce2s 16 mbit pseudo sram 64 mbit flash memory dq15 to dq0 dq15 to dq0 dq15 to dq0 a21 to a0 a21 to a0 a0 to a19 a19 to a0
6 am49pdl640ag november 20, 2003 preliminary flash memory block diagram psram block diagram v cc v ss bank 1 address bank 2 address a21?a0 reset# we# ce# dq15?dq0 wp#/acc state control & command register ry/by# bank 1 x-decoder oe# dq15?dq0 status control a21?a0 a21?a0 a21?a0 a0?a21 dq15?dq0 dq15?dq0 dq15?dq0 dq15?dq0 mux mux mux bank 2 x-decoder y-gate bank 3 x-decoder bank 4 x-decoder y-gate bank 3 address bank 4 address refresh control standby/deep power down mode control memory cell array 1 m x 16 refresh counter address buffer row address decoder input data contol control logic sense amp column decoder address buffer output data control a19-a0 dq7-dq0 dq15-dq8 ce#1 ce2 oe# we# lb# ub# v cc v ss
november 20, 2003 am49pdl640ag 7 preliminary connection diagram special package handling instructions special handling is required for flash memory products in molded packages (bga). the package and/or data integrity may be compromised if the package body is exposed to temperatures above 150 c for prolonged periods of time. a1 b1 c1 f1 g1 l1 m1 d2 e2 f2 g2 h2 j2 c3 d3 e3 f3 g3 h3 j3 k3 c4 d4 e4 f4 g4 h4 j4 k4 b5 c5 d5 e5 h5 j5 k5 l5 b6 c6 d6 e6 h6 j6 k6 l6 c7 d7 e7 f7 g7 h7 j7 k7 c8 d8 e8 f8 g8 h8 j8 k8 d9 e9 f9 g9 h9 j9 a10 b10 f10 g10 l10 m10 nc nc nc nc nc nc nc nc nc a3 a2 a1 a0 ce#f ce1#s a7 a6 a5 a4 v ss oe# dq0 dq8 lb#s ub#s a18 a17 dq1 dq9 dq10 dq2 nc wp#/acc reset#1 ry/by dq3 v cc f dq11 nc we# ce2s a20 dq4 v cc s nc a8 a19 a9 a10 dq6 dq13 dq12 dq5 a11 a12 a13 a14 nc dq15 dq7 dq14 a15 a21 nc a16 nc v ss nc nc nc nc nc nc pseudo sram only shared flash only 73-ball fbga top view
8 am49pdl640ag november 20, 2003 preliminary pin description a19?a0 = 20 address inputs (common) a21?a20 = 2 address inputs (flash) dq15?dq0 = 16 data inputs/outputs (common) ce#f = chip enable (flash) ce#1s = chip enable 1 (psram) ce2s = chip enable 2 (psram) oe# = output enable (common) we# = write enable (common) ry/by# = ready/busy output ub#s = upper byte control (psram) lb#s = lower byte control (psram) reset# = hardware reset pin, active low wp#/acc = hardware write protect/ acceleration pin (flash) v cc f = flash 3.0 volt-only single power sup- ply (see product selector guide for speed options and voltage supply tolerances) v cc s = psram power supply v ss = device ground (common) nc = pin not connected internally logic symbol 19 16 or 8 dq15?dq0 a19?a0 ce#f oe# we# reset# ub#s ry/by# wp#/acc a21?a20 lb#s ce#1s ce2s
november 20, 2003 am49pdl640ag 9 preliminary ordering information the order number (valid combination) is formed by the following: valid combinations valid combinations list configurations planned to be supported in vol- ume for this device. consult the local amd sales office to confirm availability of specific valid combinations and to check on newly re- leased combinations. mcp device bus operations this section describes the requirements and use of the device bus operations, which are initiated through the internal command register. the command register itself does not occupy any addressable memory loca- tion. the register is a latch used to store the com- mands, along with the address and data information needed to execute the command. the contents of the register serve as inputs to the internal state machine. the state machine outputs dictate the function of the device. tables 1-2 lists the device bus operations, the inputs and control levels they require, and the resulting output. the following subsections describe each of these operations in further detail. am49pdl640 a g a 70 n t tape and reel t=7 inches s = 13 inches temperature range n = light industrial (?25 c to +85 c) speed option see product selector guide and valid combinations psram vendor blank = etron a=si-7 process technology g = 0.17 m pseudo sram device density a= 16 mbits amd device number/description am49pdl640ag stacked multi-chip package (mcp) flash memory and sram am29pdl640g 64 megabit (4 m x 16-bit) cmos 3.0 volt-only, simultaneous operation flash memory and 16 mbit (1 m x 16-bit) pseudo static ram valid combinations order number package marking am49pdl640ag70n t, s m49000001y am49pdl640ag85n m49000001z am49pdl640aga70n m49000004f am29pdl640aga85n m49000004g
10 am49pdl640ag november 20, 2003 preliminary table 1. device bus operations?flash word mode, ciof = v ih legend: l = logic low = v il , h = logic high = v ih , v id = 11.5?12.5 v, v hh = 9.0 0.5 v, x = don?t care, sadd = flash sector address, a in = address in, d in = data in, d out = data out notes: 1. other operations except for those indicated in this column are inhibited. 2. do not apply ce#f1 = v il , ce1#s = v il and ce2s = v ih at the same time. 3. don?t care or open lb#s or ub#s. 4. if wp#/acc = v il , the boot sectors will be protected. if wp#/acc = v ih the boot sectors protection will be removed. if wp#/acc = v acc (9v), the program time will be reduced by 40%. 5. the sector protect and sector unprotect functions may also be implemented via programming equipment. see the ?sector/sector block protection and unprotection? section. 6. if wp#/acc = v il , the two outermost boot sectors remain protected. if wp#/acc = v ih , the two outermost boot sector protection depends on whether they were last protected or unprotected using the method described in ?sector/sector block protection and unprotection?. if wp#/acc = v hh, all sectors will be unprotected. 7. data will be retained in psram. 8. data will be lost in psram. 9. ce# inputs on both flash devices may be held low for this operation 10. deep power-down standby is not available. operation (notes 1, 2) ce#f ce1#s ce2s oe# we# addr. lb#s (note 3) ub#s (note 3) reset# wp#/ acc (note 4) dq7? dq0 dq15? dq8 read from active flash (note 7) l hh lh a in xxhl/h d out d out (note 8) h l write to active flash (note 7) l hh hl a in xxh(note 5) d in d in (note 8) h l standby v cc 0.3 v hhxxx x x v cc 0.3 v h high-z high-z deep power-down standby (note 10) v cc 0.3 v hlxxx x x v cc 0.3 v h high-z high-z output disable (note 9) l l h hh x x x h l/h high-z high-z hh x x x flash hardware reset (note 7) x hh x x x x x l l/h high-z high-z (note 8) h l sector protect (notes 5, 9) (note 7) l hh hl sadd, a6 = l, a1 = h, a0 = l xx v id l/h d in x (note 8) h l sector unprotect (notes 5, 9) (note 7) l hh hl sadd, a6 = h, a1 = h, a0 = l xx v id (note 6) d in x (note 8) h l temporary sector unprotect (note 7) x hh xx x x x v id (note 6) d in high-z (note 8) h l read from psram h l h l h a in ll hx d out d out h l high-z d out lh d out high-z write to psram h l h x l a in ll hx d in d in h l high-z d in lh d in high-z
november 20, 2003 am49pdl640ag 11 preliminary requirements for reading array data to read array data from the outputs, the system must drive the ce# and oe# pins to v il . ce# is the power control and selects the device. oe# is the output con- trol and gates array data to the output pins. we# should remain at v ih . the internal state machine is set for reading array data upon device power-up, or after a hardware reset. this ensures that no spurious alteration of the memory content occurs during the power transition. no com- mand is necessary in this mode to obtain array data. standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. each bank remains enabled for read access until the command register contents are altered. refer to the ac read-only operations table for timing specifications and to figure 14 for the timing diagram. i cc1 in the dc characteristics table represents the ac- tive current specification for reading array data. random read (non-page read) address access time (t acc ) is equal to the delay from stable addresses to valid output data. the chip enable access time (t ce ) is the delay from the stable ad- dresses and stable ce# to valid data at the output in- puts. the output enable access time is the delay from the falling edge of the oe# to valid data at the output inputs (assuming the addresses have been stable for at least t acc ?t oe time). page mode read the device is capable of fast page mode read and is compatible with the page mode mask rom read oper- ation. this mode provides faster read access speed for random locations within a page. the page size of the device is 8 words, with the appropriate page being selected by the higher address bits a21?a3 and the lsb bits a2?a0 determining the specific word within that page. this is an asynchronous operation with the microprocessor supplying the specific word location. the random or initial page access is equal to t acc or t ce and subsequent page read accesses (as long as the locations specified by the microprocessor falls within that page) is equivalent to t pac c . when ce# is deasserted and reasserted for a subsequent access, the access time is t acc or t ce . here again, ce# selects the device and oe# is the output control and should be used to gate data to the output inputs if the device is selected. fast page mode accesses are obtained by keeping a21?a3 constant and changing a2 to a0 to select the specific word within that page. table 2. page select simultaneous operation the device is capable of reading data from one bank of memory while a program or erase operation is in progress in another bank of memory (simultaneous operation), in addition to the conventional features (read, program, erase-suspend read, and erase-sus- pend program). the bank selected can be selected by bank addresses (a21?a19) with zero latency. the simultaneous operation can execute multi-func- tion mode in the same bank. table 3. bank select writing commands/command sequences to write a command or command sequence (which in- cludes programming data to the device and erasing sectors of memory), the system must drive we# and ce# to v il , and oe# to v ih . the device features an unlock bypass mode to facili- tate faster programming. once a bank enters the un- lock bypass mode, only two write cycles are required to program a word, instead of four. the ?word pro- gram command sequence? section has details on programming data to the device using both standard and unlock bypass command sequences. an erase operation can erase one sector, multiple sec- tors, or the entire device. table 4 indicates the address space that each sector occupies. a ?bank address? is the address bits required to uniquely select a bank. similarly, a ?sector address? refers to the address bits word a2 a1 a0 word 0 000 word 1 001 word 2 010 word 3 011 word 4 100 word 5 101 word 6 110 word 7 111 bank a21?a19 bank a 000 bank b 001, 010, 011 bank c 100, 101, 110 bank d 111
12 am49pdl640ag november 20, 2003 preliminary required to uniquely select a sector. the ?command definitions? section has details on erasing a sector or the entire chip, or suspending/resuming the erase op- eration. i cc2 in the dc characteristics table represents the ac- tive current specification for the write mode. the flash ac characteristics section contains timing specifica- tion tables and timing diagrams for write operations. accelerated program operation the device offers accelerated program operations through the acc function. this function is primarily in- tended to allow faster manufacturing throughput at the factory. if the system asserts v hh on this pin, the device auto- matically enters the aforementioned unlock bypass mode, temporarily unprotects any protected sectors, and uses the higher voltage on the pin to reduce the time required for program operations. the system would use a two-cycle program command sequence as required by the unlock bypass mode. removing v hh from the wp#/acc pin returns the device to nor- mal operation. note that v hh must not be asserted on wp#/acc for operations other than accelerated pro- gramming, or device damage may result. in addition, the wp#/acc pin should be raised to v cc when not in use. that is, the wp#/acc pin should not be left float- ing or unconnected; inconsistent behavior of the de- vice may result . autoselect functions if the system writes the autoselect command se- quence, the device enters the autoselect mode. the system can then read autoselect codes from the inter- nal register (which is separate from the memory array) on dq15?dq0. standard read cycle timings apply in this mode. refer to the autoselect mode and autose- lect command sequence sections for more informa- tion. standby mode when the system is not reading or writing to the de- vice, it can place the device in the standby mode. in this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the oe# input. the device enters the cmos standby mode when the ce# and reset# pins are both held at v io 0.3 v. (note that this is a more restricted voltage range than v ih .) if ce# and reset# are held at v ih , but not within v io 0.3 v, the device will be in the standby mode, but the standby current will be greater. the device re- quires standard access time (t ce ) for read access when the device is in either of these standby modes, before it is ready to read data. if the device is deselected during erasure or program- ming, the device draws active current until the operation is completed. icc3 in the table represents the cmos standby cur- rent specification. automatic sleep mode the automatic sleep mode minimizes flash device en- ergy consumption. the device automatically enables this mode when addresses remain stable for t acc + 30 ns. the automatic sleep mode is independent of the ce#, we#, and oe# control signals. standard ad- dress access timings provide new data when ad- dresses are changed. while in sleep mode, output data is latched and always available to the system. note that during automatic sleep mode, oe# must be at v ih before the device reduces current to the stated sleep mode specification. icc5 in the table repre- sents the automatic sleep mode current specification. reset#: hardware reset pin the reset# pin provides a hardware method of re- setting the device to reading array data. when the re- set# pin is driven low for at least a period of t rp , the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the reset# pulse. the device also resets the internal state ma- chine to reading array data. the operation that was in- terrupted should be reinitiated once the device is ready to accept another command sequence, to en- sure data integrity. current is reduced for the duration of the reset# pulse. when reset# is held at v ss 0.3 v, the device draws cmos standby current (icc4). if reset# is held at v il but not within v ss 0.3 v, the standby cur- rent will be greater. the reset# pin may be tied to the system reset cir- cuitry. a system reset would thus also reset the flash memory, enabling the system to read the boot-up firm- ware from the flash memory. if reset# is asserted during a program or erase op- eration, the ry/by# pin remains a ?0? (busy) until the internal reset operation is complete, which requires a time of t ready (during embedded algorithms). the sys- tem can thus monitor ry/by# to determine whether the reset operation is complete. if reset# is asserted when a program or erase operation is not executing (ry/by# pin is ?1?), the reset operation is completed within a time of t ready (not during embedded algo- rithms). the system can read data t rh after the re- set# pin returns to v ih . refer to the ac characteristics tables for reset# pa- rameters and to figure 15 for the timing diagram.
november 20, 2003 am49pdl640ag 13 preliminary output disable mode when the oe# input is at v ih , output from the device is disabled. the output pins (except for ry/by#) are placed in the high impedance state. table 4. am29pdl640g sector architecture bank sector sector address a21?a12 sector size (kwords) address range bank a sa0 0000000000 4 00000h?00fffh sa1 0000000001 4 01000h?01fffh sa2 0000000010 4 02000h?02fffh sa3 0000000011 4 03000h?03fffh sa4 0000000100 4 04000h?04fffh sa5 0000000101 4 05000h?05fffh sa6 0000000110 4 06000h?06fffh sa7 0000000111 4 07000h?07fffh sa8 0000001xxx 32 08000h?0ffffh sa9 0000010xxx 32 10000h?17fffh sa10 0000011xxx 32 18000h?1ffffh sa11 0000100xxx 32 20000h?27fffh sa12 0000101xxx 32 28000h?2ffffh sa13 0000110xxx 32 30000h?37fffh sa14 0000111xxx 32 38000h?3ffffh sa15 0001000xxx 32 40000h?47fffh sa16 0001001xxx 32 48000h?4ffffh sa17 0001010xxx 32 50000h?57fffh sa18 0001011xxx 32 58000h?5ffffh sa19 0001100xxx 32 60000h?67fffh sa20 0001101xxx 32 68000h?6ffffh sa21 0001101xxx 32 70000h?77fffh sa22 0001111xxx 32 78000h?7ffffh bank b sa23 0010000xxx 32 80000h?87fffh sa24 0010001xxx 32 88000h?8ffffh sa25 0010010xxx 32 90000h?97fffh sa26 0010011xxx 32 98000h?9ffffh sa27 0010100xxx 32 a0000h?a7fffh sa28 0010101xxx 32 a8000h?affffh sa29 0010110xxx 32 b0000h?b7fffh sa30 0010111xxx 32 b8000h?bffffh sa31 0011000xxx 32 c0000h?c7fffh sa32 0011001xxx 32 c8000h?cffffh sa33 0011010xxx 32 d0000h?d7fffh sa34 0011011xxx 32 d8000h?dffffh sa35 0011000xxx 32 e0000h?e7fffh sa36 0011101xxx 32 e8000h?effffh sa37 0011110xxx 32 f0000h?f7fffh sa38 0011111xxx 32 f8000h?fffffh sa39 0100000xxx 32 f9000h?107fffh sa40 0100001xxx 32 108000h?10ffffh sa41 0100010xxx 32 110000h?117fffh sa42 0101011xxx 32 118000h?11ffffh sa43 0100100xxx 32 120000h?127fffh sa44 0100101xxx 32 128000h?12ffffh sa45 0100110xxx 32 130000h?137fffh sa46 0100111xxx 32 138000h?13ffffh sa47 0101000xxx 32 140000h?147fffh sa48 0101001xxx 32 148000h?14ffffh sa49 0101010xxx 32 150000h?157fffh sa50 0101011xxx 32 158000h?15ffffh sa51 0101100xxx 32 160000h?167fffh sa52 0101101xxx 32 168000h?16ffffh sa53 0101110xxx 32 170000h?177fffh sa54 0101111xxx 32 178000h?17ffffh sa55 0110000xxx 32 180000h?187fffh sa56 0110001xxx 32 188000h?18ffffh sa57 0110010xxx 32 190000h?197fffh sa58 0110011xxx 32 198000h?19ffffh sa59 0100100xxx 32 1a0000h?1a7fffh sa60 0110101xxx 32 1a8000h?1affffh sa61 0110110xxx 32 1b0000h?1b7fffh sa62 0110111xxx 32 1b8000h?1bffffh sa63 0111000xxx 32 1c0000h?1c7fffh sa64 0111001xxx 32 1c8000h?1cffffh sa65 0111010xxx 32 1d0000h?1d7fffh sa66 0111011xxx 32 1d8000h?1dffffh sa67 0111100xxx 32 1e0000h?1e7fffh sa68 0111101xxx 32 1e8000h?1effffh sa69 0111110xxx 32 1f0000h?1f7fffh sa70 0111111xxx 32 1f8000h?1fffffh table 4. am29pdl640g sector architecture bank sector sector address a21?a12 sector size (kwords) address range
14 am49pdl640ag november 20, 2003 preliminary table 5. bank address table 6. secsi tm sector secure sector addresses bank c sa71 1000000xxx 32 200000h?207fffh sa72 1000001xxx 32 208000h?20ffffh sa73 1000010xxx 32 210000h?217fffh sa74 1000011xxx 32 218000h?21ffffh sa75 1000100xxx 32 220000h?227fffh sa76 1000101xxx 32 228000h?22ffffh sa77 1000110xxx 32 230000h?237fffh sa78 1000111xxx 32 238000h?23ffffh sa79 1001000xxx 32 240000h?247fffh sa80 1001001xxx 32 248000h?24ffffh sa81 1001010xxx 32 250000h?257fffh sa82 1001011xxx 32 258000h?25ffffh sa83 1001100xxx 32 260000h?267fffh sa84 1001101xxx 32 268000h?26ffffh sa85 1001110xxx 32 270000h?277fffh sa86 1001111xxx 32 278000h?27ffffh sa87 1010000xxx 32 280000h?28ffffh sa88 1010001xxx 32 288000h?28ffffh sa89 1010010xxx 32 290000h?297fffh sa90 1010011xxx 32 298000h?29ffffh sa91 1010100xxx 32 2a0000h?2a7fffh sa92 1010101xxx 32 2a8000h?2affffh sa93 1010110xxx 32 2b0000h?2b7fffh sa94 1010111xxx 32 2b8000h?2bffffh sa95 1011000xxx 32 2c0000h?2c7fffh sa96 1011001xxx 32 2c8000h?2cffffh sa97 1011010xxx 32 2d0000h?2d7fffh sa98 1011011xxx 32 2d8000h?2dffffh sa99 1011100xxx 32 2e0000h?2e7fffh sa100 1011101xxx 32 2e8000h?2effffh sa101 1011110xxx 32 2f0000h?2fffffh sa102 1011111xxx 32 2f8000h?2fffffh sa103 1100000xxx 32 300000h?307fffh sa104 1100001xxx 32 308000h?30ffffh sa105 1100010xxx 32 310000h?317fffh sa106 1100011xxx 32 318000h?31ffffh sa107 1100100xxx 32 320000h?327fffh sa108 1100101xxx 32 328000h?32ffffh sa109 1100110xxx 32 330000h?337fffh sa110 1100111xxx 32 338000h?33ffffh table 4. am29pdl640g sector architecture bank sector sector address a21?a12 sector size (kwords) address range bank d sa119 1110000xxx 32 380000h?387fffh sa120 1110001xxx 32 388000h?38ffffh sa121 1110010xxx 32 390000h?397fffh sa122 1110011xxx 32 398000h?39ffffh sa123 1110100xxx 32 3a0000h?3a7fffh sa124 1110101xxx 32 3a8000h?3affffh sa125 1110110xxx 32 3b0000h?3b7fffh sa126 1110111xxx 32 3b8000h?3bffffh sa127 1111000xxx 32 3c0000h?3c7fffh sa128 1111001xxx 32 3c8000h?3cffffh sa129 1111010xxx 32 3d0000h?3d7fffh sa130 1111011xxx 32 3d8000h?3dffffh sa131 1111100xxx 32 3e0000h?3e7fffh sa132 1111101xxx 32 3e8000h?3effffh sa133 1111110xxx 32 3f0000h?3f7fffh sa134 1111111000 4 3f8000h?3f8fffh sa135 1111111001 4 3f9000h?3f9fffh sa136 1111111010 4 3fa000h?3fafffh sa137 1111111011 4 3fb000h?3fbfffh sa138 1111111100 4 3fc000h?3fcfffh sa139 1111111101 4 3fd000h?3fdfffh sa140 1111111110 4 3fe000h?3fefffh sa141 1111111111 4 3ff000h?3fffffh bank a21?a19 a000 b 001, 010, 011 c 100, 101, 110 d111 device sector size address range am29pdl640g 128 words 00000h?0007fh table 4. am29pdl640g sector architecture bank sector sector address a21?a12 sector size (kwords) address range
november 20, 2003 am49pdl640ag 15 preliminary autoselect mode the autoselect mode provides manufacturer and de- vice identification, and sector protection verification, through identifier codes output on dq7?dq0. this mode is primarily intended for programming equip- ment to automatically match a device to be pro- grammed with its corresponding programming algorithm. however, the autoselect codes can also be accessed in-system through the command register. when using programming equipment, the autoselect mode requires v id on address pin a9. address pins must be as shown in table 7. in addition, when verify- ing sector protection, the sector address must appear on the appropriate highest order address bits (see table 4). table 7 shows the remaining address bits that are don?t care. when all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on dq7?dq0. however, the autoselect codes can also be accessed in-system through the command register, for instances when the device is erased or programmed in a system without access to high voltage on the a9 pin. the com- mand sequence is illustrated in table 14. note that if a bank address (ba) on address bits a21, a20, and a19 is asserted during the third write cycle of the autose- lect command, the host system can read autoselect data that bank and then immediately read array data from the other bank, without exiting the autoselect mode. to access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in table 14. this method does not require v id . refer to the autoselect com- mand sequence section for more information. table 7. am29pdl640g boot sector/sector block addresses for protection/unprotection sector a21?a12 sector/ sector block size sa0 0000000000 4 kwords sa1 0000000001 4 kwords sa2 0000000010 4 kwords sa3 0000000011 4 kwords sa4 0000000100 4 kwords sa5 0000000101 4 kwords sa6 0000000110 4 kwords sa7 0000000111 4 kwords sa8?sa10 0000001xxx, 0000010xxx, 0000011xxx 96 (3x32) kwords sa11?sa14 00001xxxxx 128 (4x32) kwords sa15?sa18 00010xxxxx 128 (4x32) kwords sa19?sa22 00011xxxxx 128 (4x32) kwords sa23?sa26 00100xxxxx 128 (4x32) kwords sa27-sa30 00101xxxxx 128 (4x32) kwords sa31-sa34 00110xxxxx 128 (4x32) kwords sa35-sa38 00111xxxxx 128 (4x32) kwords sa39-sa42 01000xxxxx 128 (4x32) kwords sa43-sa46 01001xxxxx 128 (4x32) kwords sa47-sa50 01010xxxxx 128 (4x32) kwords sa51-sa54 01011xxxxx 128 (4x32) kwords sa55?sa58 01100xxxxx 128 (4x32) kwords sa59?sa62 01101xxxxx 128 (4x32) kwords sa63?sa66 01110xxxxx 128 (4x32) kwords sa67?sa70 01111xxxxx 128 (4x32) kwords sa71?sa74 10000xxxxx 128 (4x32) kwords sa75?sa78 10001xxxxx 128 (4x32) kwords sa79?sa82 10010xxxxx 128 (4x32) kwords sa83?sa86 10011xxxxx 128 (4x32) kwords sa87?sa90 10100xxxxx 128 (4x32) kwords sa91?sa94 10101xxxxx 128 (4x32) kwords sa95?sa98 10110xxxxx 128 (4x32) kwords sa99?sa102 10111xxxxx 128 (4x32) kwords sa103?sa106 11000xxxxx 128 (4x32) kwords sa107?sa110 11001xxxxx 128 (4x32) kwords sa111?sa114 11010xxxxx 128 (4x32) kwords sa115?sa118 11011xxxxx 128 (4x32) kwords sa119?sa122 11100xxxxx 128 (4x32) kwords sa123?sa126 11101xxxxx 128 (4x32) kwords sa127?sa130 11110xxxxx 128 (4x32) kwords sa131?sa133 1111100xxx, 1111101xxx, 1111110xxx 96 (3x32) kwords sa134 1111111000 4 kwords sa135 1111111001 4 kwords sa136 1111111010 4 kwords sa137 1111111011 4 kwords sa138 1111111100 4 kwords sa139 1111111101 4 kwords sa140 1111111101 4 kwords sa141 1111111111 4 kwords sector a21?a12 sector/ sector block size
16 am49pdl640ag november 20, 2003 preliminary sector protection the am29pdl640g features several levels of sector protection, which can disable both the program and erase operations in certain sectors or sector groups: persistent sector protection a command sector protection method that replaces the old 12 v controlled protection method. password sector protection a highly sophisticated protection method that requires a password before changes to certain sectors or sec- tor groups are permitted wp# hardware protection a write protect pin that can prevent program or erase operations in sectors 0, 1, 140, and 141. all parts default to operate in the persistent sector protection mode. the customer must then choose if the persistent or password protection method is most desirable. there are two one-time programmable non-volatile bits that define which sector protection method will be used. if the persistent sector protec- tion method is desired, programming the persistent sector protection mode locking bit permanently sets the device to the persistent sector protection mode. if the password sector protection method is de- sired, programming the password mode locking bit permanently sets the device to the password sector protection mode. it is not possible to switch between the two protection modes once a locking bit has been set. one of the two modes must be selected when the device is first programmed. this prevents a pro- gram or virus from later setting the password mode locking bit, which would cause an unexpected shift from the default persistent sector protection mode into the password protection mode. the wp# hardware protection feature is always avail- able, independent of the software managed protection method chosen. the device is shipped with all sectors unprotected. amd offers the option of programming and protecting sectors at the factory prior to shipping the device through amd?s expressflash? service. contact an amd representative for details. it is possible to determine whether a sector is pro- tected or unprotected. see autoselect mode for de- tails. persistent sector protection the persistent sector protection method replaces the 12 v controlled protection method in previous amd flash devices. this new method provides three differ- ent sector protection states: persistently locked ?the sector is protected and cannot be changed. dynamically locked ?the sector is protected and can be changed by a simple command. unlocked ?the sector is unprotected and can be changed by a simple command. to achieve these states, three types of ?bits? are used: persistent protection bit (ppb) a single persistent (non-volatile) protection bit is as- signed to a maximum four sectors (see the sector ad- dress tables for specific sector protection groupings). all 4 kword boot-block sectors have individual sector persistent protection bits ( ppbs) for greater flexibility. each ppb is individually modifiable through the ppb write command . the device erases all ppbs in parallel. if any ppb re- quires erasure, the device must be instructed to pre- program all of the sector ppbs prior to ppb erasure. otherwise, a previously er ased sector ppbs can po- tentially be over-erased. the flash device does not have a built-in means of preventing sector ppbs over-erasure . persistent protection bit lock (ppb lock) the persistent protection bit lock (ppb lock) is a glo- bal volatile bit. when set to ?1?, the ppbs cannot be changed. when cleared (?0?), the ppbs are change- able. there is only one ppb lock bit per device. the ppb lock is cleared after power-up or hardware reset. there is no command sequence to unlock the ppb lock. dynamic protection bit (dyb) a volatile protection bit is assigned for each sector. after power-up or hardware reset, the contents of all dybs is ?0?. each dyb is individually modifiable through the dyb write command. when the parts are first shipped, the ppbs are cleared, the dybs are cleared, and ppb lock is de- faulted to power up in the cleared state ? meaning the ppbs are changeable. when the device is first powered on the dybs power up cleared (sectors not protected). the protection state for each sector is determined by the logical or of the ppb and the dyb related to that sector. for the sectors that have the ppbs cleared, the dybs control whether or not the sector is protected or unprotected. by issuing the dyb write command sequences, the dybs will be set or cleared, thus placing each sector in the protected or unprotected state. these are the so-called dynamic locked or unlocked states. they are called dynamic states because it is very easy to
november 20, 2003 am49pdl640ag 17 preliminary switch back and forth between the protected and un- protected conditions. this allows software to easily protect sectors against inadvertent changes yet does not prevent the easy removal of protection when changes are needed. the dybs maybe set or cleared as often as needed. the ppbs allow for a more static, and difficult to change, level of protection. the ppbs retain their state across power cycles because they are non-volatile. in- dividual ppbs are set with a command but must all be cleared as a group through a complex sequence of program and erasing commands. the ppbs are also limited to 100 erase cycles. the ppb lock bit adds an additional level of protec- tion. once all ppbs are programmed to the desired settings, the ppb lock may be set to ?1?. setting the ppb lock disables all program and erase commands to the non-volatile ppbs. in effect, the ppb lock bit locks the ppbs into their current state. the only way to clear the ppb lock is to go through a power cycle. system boot code can determine if any changes to the ppb are needed; for example, to allow new system code to be downloaded. if no changes are needed then the boot code can set the ppb lock to disable any further changes to the ppbs during system opera- tion. the wp#/acc write protect pin adds a final level of hardware protection to sectors 0, 1, 140, and 141. when this pin is low it is not possible to change the contents of these sectors. these sectors generally hold system boot code. the wp#/acc pin can prevent any changes to the boot code that could override the choices made while setting up sector protection during system initialization. it is possible to have sectors that have been persis- tently locked, and sectors that are left in the dynamic state. the sectors in the dynamic state are all unpro- tected. if there is a need to protect some of them, a simple dyb write command sequence is all that is necessary. the dyb write command for the dynamic sectors switch the dybs to signify protected and un- protected, respectively. if there is a need to change the status of the persistently locked sectors, a few more steps are required. first, the ppb lock bit must be dis- abled by either putting the device through a power-cy- cle, or hardware reset. the ppbs can then be changed to reflect the desired settings. setting the ppb lock bit once again will lock the ppbs, and the de- vice operates normally again. the best protection is achieved by executing the ppb lock bit set command early in the boot code, and pro- tect the boot code by holding wp#/acc = v il . table 8. sector protection schemes table 9 contains all possible combinations of the dyb, ppb, and ppb lock relating to the status of the sector. in summary, if the ppb is set, and the ppb lock is set, the sector is protected and the protection can not be removed until the next power cycle clears the ppb lock. if the ppb is cleared, the sector can be dynami- cally locked or unlocked. the dyb then controls whether or not the sector is protected or unprotected. if the user attempts to program or erase a protected sector, the device ignores the command and returns to read mode. a program command to a protected sector enables status polling for approximately 1 s before the device returns to read mode without having modi- fied the contents of the protected sector. an erase command to a protected sector enables status polling for approximately 50 s after which the device returns to read mode without having erased the protected sec- tor. the programming of the dyb, ppb, and ppb lock for a given sector can be verified by writing a dyb/ppb/ppb lock verify command to the device. persistent sector protection mode locking bit like the password mode locking bit, a persistent sec- tor protection mode locking bit exists to guarantee that the device remain in software sector protection. once set, the persistent sector protection locking bit pre- vents programming of the password protection mode locking bit. this guarantees that a hacker could not place the device in password protection mode. password protection mode the password sector protection mode method allows an even higher level of security than the persistent sector protection mode. there are two main differ- ences between the persistent sector protection and the password sector protection mode: dyb ppb ppb lock sector state 000 unprotected?ppb and dyb are changeable 001 unprotected?ppb not changeable, dyb is changeable 010 protected?ppb and dyb are changeable 100 110 011 protected?ppb not changeable, dyb is changeable 101 111
18 am49pdl640ag november 20, 2003 preliminary when the device is first powered on, or comes out of a reset cycle, the ppb lock bit set to the locked state , rather than cleared to the unlocked state. the only means to clear the ppb lock bit is by writ- ing a unique 64-bit password to the device. the password sector protection method is otherwise identical to the persistent sector protection method. a 64-bit password is the only additional tool utilized in this method. the password is stored in a one-time programmable (otp) region of the flash memory. once the password mode locking bit is set, the password is permanently set with no means to read, program, or erase it. the password is used to clear the ppb lock bit. the pass- word unlock command must be written to the flash, along with a password. the flash device internally compares the given password with the pre-pro- grammed password. if they match, the ppb lock bit is cleared, and the ppbs can be altered. if they do not match, the flash device does nothing. there is a built-in 2 s delay for each ?password check.? this delay is intended to thwart any efforts to run a program that tries all possible combinations in order to crack the password. password and password mode locking bit in order to select the password sector protection scheme, the customer must first program the pass- word. the password may be correlated to the unique electronic serial number (esn) of the particular flash device. each esn is different for every flash device; therefore each password should be different for every flash device. while programming in the password re- gion, the customer may perform password verify oper- ations. once the desired password is programmed in, the customer must then set the password mode locking bit. this operation achieves two objectives: 1. permanently sets the device to operate using the password protection mode. it is not possible to re- verse this function. 2. disables all further commands to the password re- gion. all program, and read operations are ignored. both of these objectives are important, and if not care- fully considered, may lead to unrecoverable errors. the user must be sure that the password protection method is desired when setting the password mode locking bit. more importantly, the user must be sure that the password is correct when the password mode locking bit is set. due to the fact that read operations are disabled, there is no means to verify what the password is afterwards. if the password is lost after setting the password mode locking bit, there will be no way to clear the ppb lock bit. the password mode locking bit, once set, prevents reading the 64-bit password on the dq bus and further password programming. the password mode locking bit is not erasable. once password mode locking bit is programmed, the persistent sector protection lock- ing bit is disabled from programming, guaranteeing that no changes to the protection scheme are allowed. 64-bit password the 64-bit password is located in its own memory space and is accessible through the use of the pass- word program and verify commands (see ?password verify command?). the password function works in conjunction with the password mode locking bit, which when set, prevents the password verify com- mand from reading the contents of the password on the pins of the device. write protect (wp#) the write protect feature provides a hardware method of protecting sectors 0, 1, 140, and 141 without using v id . this function is provided by the wp# pin and over- rides the previously discussed high voltage sector protection method. if the system asserts v il on the wp#/acc pin, the de- vice disables program and erase functions in the two outermost 4 kword sectors on both ends of the flash array independent of whether it was previously pro- tected or unprotected. if the system asserts v ih on the wp#/acc pin, the de- vice reverts to whether sectors 0, 1, 140, and 141 were last set to be protected or unprotected. that is, sector protection or unprotection for these sectors de- pends on whether they were last protected or unpro- tected using the method described in high voltage sector protection. note that the wp#/acc pin must not be left floating or unconnected; inconsistent behavior of the device may result. persistent protection bit lock the persistent protection bit (ppb) lock is a volatile bit that reflects the state of the password mode lock- ing bit after power-up reset. if the password mode lock bit is also set after a hardware reset (reset# asserted) or a power-up reset, the only means for clearing the ppb lock bit in password protection mode is to issue the password unlock command. suc- cessful execution of the password unlock command clears the ppb lock bit, allowing for sector ppbs modifications. asserting reset#, taking the device through a power-on reset, or issuing the ppb lock bit set command sets the ppb lock bit to a ?1? when the password mode lock bit is not set.
november 20, 2003 am49pdl640ag 19 preliminary if the password mode locking bit is not set, including persistent protection mode, the ppb lock bit is cleared after power-up or hardware reset. the ppb lock bit is set by issuing the ppb lock bit set com- mand. once set the only means for clearing the ppb lock bit is by issuing a hardware or power-up reset. the password unlock command is ignored in persis- tent protection mode. high voltage sector protection sector protection and unprotection may also be imple- mented using programming equipment. the proce- dure requires high voltage (v id ) to be placed on the reset# pin. refer to figure note: for details on this procedure. note that for sector unprotect, all unpro- tected sectors must first be protected prior to the first sector write cycle.
20 am49pdl640ag november 20, 2003 preliminary note: these algorithms are valid only in persistent sector protection mode. they are not valid in password protection mode. figure 1. in-system sector protection/ sector unprotection algorithms sector protect: write 60h to sector address with a6 = 0, a1 = 1, a0 = 0 set up sector address wait 150 s verify sector protect: write 40h to sector address with a6 = 0, a1 = 1, a0 = 0 read from sector address with a6 = 0, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 s first write cycle = 60h? data = 01h? remove v id from reset# write reset command sector protect complete yes yes no plscnt = 25? yes device failed increment plscnt temporary sector unprotect mode no sector unprotect: write 60h to sector address with a6 = 1, a1 = 1, a0 = 0 set up first sector address wait 15 ms verify sector unprotect: write 40h to sector address with a6 = 1, a1 = 1, a0 = 0 read from sector address with a6 = 1, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 s data = 00h? last sector verified? remove v id from reset# write reset command sector unprotect complete yes no plscnt = 1000? yes device failed increment plscnt temporary sector unprotect mode no all sectors protected? yes protect all sectors: the indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address set up next sector address no yes no yes no no yes no sector protect algorithm sector unprotect algorithm first write cycle = 60h? protect another sector? reset plscnt = 1
november 20, 2003 am49pdl640ag 21 preliminary temporary sector unprotect this feature allows temporary unprotection of previ- ously protected sectors to change data in-system. the sector unprotect mode is activated by setting the re- set# pin to v id . during this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. once v id is removed from the re- set# pin, all the previously protected sectors are protected again. figure 2 shows the algorithm, and figure 23 shows the timing diagrams, for this feature. figure 2. temporar y sector unprotect operation secsi? (secured silicon) sector sectorflash memory region the secsi (secured silicon) sector feature provides a flash memory region that enables permanent part identification through an electronic serial number (esn). the secsi sector is up to 128 words in length, and uses a secsi sector indicator bit (dq7) to indi- cate whether or not the secsi sector is locked when shipped from the factory. this bit is permanently set at the factory and cannot be changed, which prevents cloning of a factory locked part. this ensures the secu- rity of the esn once the product is shipped to the field. amd offers the device with the secsi sector either factory locked or customer lockable. the fac- tory-locked version is always protected when shipped from the factory, and has the secsi (secured silicon) sector indicator bit permanently set to a ?1.? the cus- tomer-lockable version is shipped with the secsi sec- tor unprotected, allowing customers to utilize the sector in any manner they choose. the customer-lock- able version has the secsi (secured silicon) sector indicator bit permanently set to a ?0.? thus, the secsi sector indicator bit prevents customer-lockable de- vices from being used to replace devices that are fac- tory locked. the system accesses the secsi sector through a command sequence (see ?enter secsi? sector/exit secsi sector command sequence?). after the system has written the enter secsi sector command se- quence, it may read the secsi sector by using the ad- dresses normally occupied by the boot sectors. this mode of operation continues until the system issues the exit secsi sector command sequence, or until power is removed from the device. on power-up, or following a hardware reset, the device reverts to send- ing commands to the normal address space. note that the acc function and unlock bypass modes are not available when the secsi sector is enabled. factory locked: secsi sector programmed and protected at the factory in a factory locked device, the secsi sector is pro- tected when the device is shipped from the factory. the secsi sector cannot be modified in any way. the device is preprogrammed with both a random number and a secure esn. the secsi sector is located at ad- dresses 000000h?00007fh in persistent protection mode, and at addresses 000005h?00007fh in pass- word protection mode. the device is available prepro- grammed with one of the following: a random, secure esn only customer code through the expressflash service both a random, secure esn and customer code through the expressflash service. customers may opt to have their code programmed by amd through the amd expressflash service. amd programs the customer?s code, with or without the ran- dom esn. the devices are then shipped from amd?s factory with the secsi sector permanently locked. contact an amd representative for details on using amd?s expressflash service. customer lockable: secsi sector not programmed or protected at the factory if the security feature is not required, the secsi sec- torsecure sector can be treated as an additional flash memory space. the secsi sector can be read any start perform erase or program operations reset# = v ih temporary sector unprotect completed (note 2) reset# = v id (note 1) notes: 1. all protected sectors unprotected (if wp#/acc = v il , sectors 0, 1, 140, 141 will remain protected). 2. all previously protected sectors are protected once again.
22 am49pdl640ag november 20, 2003 preliminary number of times, but can be programmed and locked only once. note that the accelerated programming (acc) and unlock bypass functions are not available when programming the secsi sector. the secsi sector area can be protected using one of the following procedures: write the three-cycle enter secsi sector region command sequence, and then follow the in-system sector protect algorithm as shown in figure note:, except that reset# may be at either v ih or v id . this allows in-system protection of the secsi sector region without raising any device pin to a high volt- age. note that this method is only applicable to the secsi sector. to verify the protect/unprotect status of the secsi sector, follow the algorithm shown in figure 3. once the secsi sector is locked and verified, the sys- tem must write the exit secsi sector region com- mand sequence to return to reading and writing the remainder of the array. the secsi sector lock must be used with caution since, once locked, there is no procedure available for unlocking the secsi sector area and none of the bits in the secsi sector memory space can be modified in any way. secsi sector protection bit the secsi sector protection bit prevents program- ming of the secsi sector memory area. once set, the secsi sector memory area contents are non-modifi- able. figure 3. secsi sector protect verify write 60h to any address write 40h to secsi sector address with a6 = 0, a1 = 1, a0 = 0 start reset# = v ih or v id wait 1 s read from secsi sector address with a6 = 0, a1 = 1, a0 = 0 if data = 00h, secsi sector is unprotected. if data = 01h, secsi sector is protected. remove v ih or v id from reset# write reset command secsi sector protect verify complete
november 20, 2003 am49pdl640ag 23 preliminary hardware data protection the command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes. in addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during v cc power-up and power-down transitions, or from system noise. low v cc write inhibit when v cc is less than v lko , the device does not ac- cept any write cycles. this protects data during v cc power-up and power-down. the command register and all internal program/erase circuits are disabled, and the device resets to the read mode. subsequent writes are ignored until v cc is greater than v lko . the system must provide the proper signals to the control pins to prevent unintentional writes when v cc is greater than v lko . write pulse ?glitch? protection noise pulses of less than 5 ns (typical) on oe#, ce# or we# do not initiate a write cycle. logical inhibit write cycles are inhibited by holding any one of oe# = v il , ce# = v ih or we# = v ih . to initiate a write cycle, ce# and we# must be a logical zero while oe# is a logical one. power-up write inhibit if we# = ce# = v il and oe# = v ih during power up, the device does not accept commands on the rising edge of we#. the internal state machine is automati- cally reset to the read mode on power-up. common flash memory interface (cfi) the common flash interface (cfi) specification out- lines device and host system software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. software support can then be device-inde- pendent, jedec id-independent, and forward- and backward-compatible for the specified flash device families. flash vendors can standardize their existing interfaces for long-term compatibility. this device enters the cfi query mode when the sys- tem writes the cfi query command, 98h, to address 55h, any time the device is ready to read array data. the system can read cfi information at the addresses given in tables 10?13. to terminate reading cfi data, the system must write the reset command. the cfi query mode is not accessible when the device is exe- cuting an embedded program or embedded erase al- gorithm. the system can also write the cfi query command when the device is in the autoselect mode. the device enters the cfi query mode, and the system can read cfi data at the addresses given in tables 10?13. the system must write the reset command to return the device to reading array data. for further information, please refer to the cfi specifi- cation and cfi publication 100, available via the world wide web at http://www.amd.com/flash/cfi. alterna- tively, contact an amd representative for copies of these documents.
24 am49pdl640ag november 20, 2003 preliminary table 9. cfi query identification string table 10. system interface string addresses data description 10h 11h 12h 0051h 0052h 0059h query unique ascii string ?qry? 13h 14h 0002h 0000h primary oem command set 15h 16h 0040h 0000h address for primary extended table 17h 18h 0000h 0000h alternate oem command set (00h = none exists) 19h 1ah 0000h 0000h address for alternate oem extended table (00h = none exists) addresses data description 1bh 0027h v cc min. (write/erase) d7?d4: volt, d3?d0: 100 millivolt 1ch 0031h v cc max. (write/erase) d7?d4: volt, d3?d0: 100 millivolt 1dh 0000h v pp min. voltage (00h = no v pp pin present) 1eh 0000h v pp max. voltage (00h = no v pp pin present) 1fh 0004h typical timeout per single byte/word write 2 n s 20h 0000h typical timeout for min. size buffer write 2 n s (00h = not supported) 21h 0009h typical timeout per individual block erase 2 n ms 22h 0000h typical timeout for full chip erase 2 n ms (00h = not supported) 23h 0005h max. timeout for byte/word write 2 n times typical 24h 0000h max. timeout for buffer write 2 n times typical 25h 0004h max. timeout per individual block erase 2 n times typical 26h 0000h max. timeout for full chip erase 2 n times typical (00h = not supported)
november 20, 2003 am49pdl640ag 25 preliminary table 11. device geometry definition addresses data description 27h 0017h device size = 2 n byte 28h 29h 0001h 0000h flash device interface description (refer to cfi publication 100) 2ah 2bh 0000h 0000h max. number of byte in multi-byte write = 2 n (00h = not supported) 2ch 0003h number of erase block regions within device 2dh 2eh 2fh 30h 0007h 0000h 0020h 0000h erase block region 1 information (refer to the cfi specification or cfi publication 100) 31h 32h 33h 34h 007dh 0000h 0000h 0001h erase block region 2 information (refer to the cfi specification or cfi publication 100) 35h 36h 37h 38h 0007h 0000h 0020h 0000h erase block region 3 information (refer to the cfi specification or cfi publication 100) 39h 3ah 3bh 3ch 0000h 0000h 0000h 0000h erase block region 4 information (refer to the cfi specification or cfi publication 100)
26 am49pdl640ag november 20, 2003 preliminary table 12. primary vendor-specific extended query addresses data description 40h 41h 42h 0050h 0052h 0049h query-unique ascii string ?pri? 43h 0031h major version number, ascii (reflects modifications to the silicon) 44h 0033h minor version number, ascii (reflects modifications to the cfi table) 45h 0004h address sensitive unlock (bits 1-0) 0 = required, 1 = not required silicon revision number (bits 7-2) 46h 0002h erase suspend 0 = not supported, 1 = to read only, 2 = to read & write 47h 0001h sector protect 0 = not supported, x = number of sectors in per group 48h 0001h sector temporary unprotect 00 = not supported, 01 = supported 49h 0007h sector protect/unprotect scheme 01 =29f040 mode, 02 = 29f016 mode, 03 = 29f400, 04 = 29lv800 mode 4ah 0077h simultaneous operation 00 = not supported, x = number of sectors excluding bank 1 4bh 0000h burst mode type 00 = not supported, 01 = supported 4ch 0002h page mode type 00 = not supported, 01 = 4 word page, 02 = 8 word page 4dh 0085h acc (acceleration) supply minimum 00h = not supported, d7-d4: volt, d3-d0: 100 mv 4eh 0095h acc (acceleration) supply maximum 00h = not supported, d7-d4: volt, d3-d0: 100 mv 4fh 0001h top/bottom boot sector flag 00h = uniform device, 02h = bottom boot device, 03h = top boot device, 04h = both top and bottom 50h 0001h program suspend 0 = not supported, 1 = supported 57h 0004h bank organization 00 = data at 4ah is zero, x = number of banks 58h 0017h bank 1 region information x = number of sectors in bank 1 59h 0030h bank 2 region information x = number of sectors in bank 2 5ah 0030h bank 3 region information x = number of sectors in bank 3 5bh 0017h bank 4 region information x = number of sectors in bank 4
november 20, 2003 am49pdl640ag 27 preliminary command definitions writing specific address and data commands or se- quences into the command register initiates device op- erations. table 14 defines the valid register command sequences. writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. a reset command is then required to return the device to reading array data. all addresses are latched on the falling edge of we# or ce#, whichever happens later. all data is latched on the rising edge of we# or ce#, whichever happens first. refer to the ac characteristics section for timing diagrams. reading array data the device is automatically set to reading array data after device power-up. no commands are required to retrieve data. each bank is ready to read array data after completing an embedded program or embedded erase algorithm. after the device accepts an erase suspend command, the corresponding bank enters the erase-sus- pend-read mode, after which the system can read data from any non-erase-suspended sector within the same bank. the system can read array data using the standard read timing, except that if it reads at an ad- dress within erase-suspended sectors, the device out- puts status data. after completing a programming operation in the erase suspend mode, the system may once again read array data with the same excep- tion. see the erase suspend/erase resume com- mands section for more information. the system must issue the reset command to return a bank to the read (or erase-suspend-read) mode if dq5 goes high during an active program or erase opera- tion, or if the bank is in the autoselect mode. see the next section, reset command, for more information. note that the acc function and unlock bypass modes are not available when the secsi sector is enabled. see also requirements for reading array data in the section for more information. the read-only opera- tions table provides the read parameters, and figure 14 shows the timing diagram. reset command writing the reset command resets the banks to the read or erase-suspend-read mode. address bits are don?t cares for this command. the reset command may be written between the se- quence cycles in an erase command sequence before erasing begins. this resets the bank to which the sys- tem was writing to the read mode. once erasure be- gins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the sequence cycles in a program command sequence before programming begins. this resets the bank to which the system was writing to the read mode. if the program command sequence is written to a bank that is in the erase suspend mode, writing the reset command returns that bank to the erase-sus- pend-read mode. once programming begins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the se- quence cycles in an autoselect command sequence. once in the autoselect mode, the reset command must be written to return to the read mode. if a bank entered the autoselect mode while in the erase sus- pend mode, writing the reset command returns that bank to the erase-suspend-read mode. if dq5 goes high during a program or erase operation, writing the reset command returns the banks to the read mode (or erase-suspend-read mode if that bank was in erase suspend). autoselect command sequence the autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected. the autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend-read mode. the autoselect command may not be written while the device is actively pro- gramming or erasing in the other bank. the autoselect command sequence is initiated by first writing two unlock cycles. this is followed by a third write cycle that contains the bank address and the au- toselect command. the bank then enters the autose- lect mode. the system may read any number of autoselect codes without reinitiating the command se- quence. table 14 shows the address and data requirements. to determine sector protection information, the system must write to the appropriate bank address (ba) and sector address (sa). table 4 shows the address range and bank number associated with each sector. the system must write the reset command to return to the read mode (or erase-suspend-read mode if the bank was previously in erase suspend).
28 am49pdl640ag november 20, 2003 preliminary enter secsi? sector/exit secsi sector command sequence the secsi sector region provides a secured data area containing a random, eight wo rd electronic serial num- ber (esn). the system can access the secsi sector region by issuing the three-cycle enter secsi sector command sequence. the device continues to access the secsi sector region until the system issues the four-cycle exit secsi sector command sequence. the exit secsi sector command sequence returns the de- vice to normal operation. the secsi sector is not ac- cessible when the device is executing an embedded program or embedded erase algorithm. table 14 shows the address and data requirements for both command sequences. see also ?secsi? (secured sili- con) sector sectorflash memory region? for further information. note that the acc function and unlock by- pass modes are not available when the secsi sector is enabled. word program command sequence programming is a four-bus-cycle operation. the pro- gram command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. the program address and data are written next, which in turn initiate the embedded program al- gorithm. the system is not required to provide further controls or timings. the device automatically provides internally generated program pulses and verifies the programmed cell margin. table 14 shows the address and data requirements for the program command se- quence. when the embedded program algorithm is complete, that bank then returns to the read mode and ad- dresses are no longer latched. the system can deter- mine the status of the program operation by using dq7, dq6, or ry/by#. refer to the write operation status section for information on these status bits. any commands written to the device during the em- bedded program algorithm are ignored. note that a hardware reset immediately terminates the program operation. the program command sequence should be reinitiated once that bank has returned to the read mode, to ensure data integrity. note that the secsi sector, autoselect, and cfi functions are unavailable when a program operation is in progress. programming is allowed in any sequence and across sector boundaries. a bit cannot be programmed from ?0? back to a ?1.? attempting to do so may cause that bank to set dq5 = 1, or cause the dq7 and dq6 status bits to indicate the operation was success- ful. however, a succeeding read will show that the data is still ?0.? only erase operations can convert a ?0? to a ?1.? unlock bypass command sequence the unlock bypass feature allows the system to pro- gram data to a bank faster than using the standard program command sequence. the unlock bypass command sequence is initiated by first writing two un- lock cycles. this is followed by a third write cycle con- taining the unlock bypass command, 20h. that bank then enters the unlock bypass mode. a two-cycle un- lock bypass program command sequence is all that is required to program in this mode. the first cycle in this sequence contains the unlock bypass program com- mand, a0h; the second cycle contains the program address and data. additional data is programmed in the same manner. this mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total program- ming time. table 14 shows the requirements for the command sequence. during the unlock bypass mode, only the unlock by- pass program and unlock bypass reset commands are valid. to exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset com- mand sequence. the first cycle must contain the bank address and the data 90h. the second cycle need only contain the data 00h. the bank then returns to the read mode. the device offers accelerated program operations through the wp#/acc pin. when the system asserts v hh on the wp#/acc pin, the device automatically en- ters the unlock bypass mode. the system may then write the two-cycle unlock bypass program command sequence. the device uses the higher voltage on the wp#/acc pin to accelerate the operation. note that the wp#/acc pin must not be at v hh any operation other than accelerated programming, or device dam- age may result. in addition, the wp#/acc pin must not be left floating or unconnected; inconsistent behavior of the device may result. figure 4 illustrates the algorithm for the program oper- ation. refer to the erase and program operations table in the ac characteristics section for parameters, and figure 16 for timing diagrams.
november 20, 2003 am49pdl640ag 29 preliminary figure 4. program operation chip erase command sequence chip erase is a six bus cycle operation. the chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the embedded erase algorithm. the device does not require the system to preprogram prior to erase. the embedded erase algo- rithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. the system is not required to provide any con- trols or timings during these operations. table 14 shows the address and data requirements for the chip erase command sequence. when the embedded erase algorithm is complete, that bank returns to the read mode and addresses are no longer latched. the system can determine the sta- tus of the erase operation by using dq7, dq6, dq2, or ry/by#. refer to the write operation status sec- tion for information on these status bits. note that the secsi sector, autoselect, and cfi functions are un- available when an erase operation is in progress. any commands written during the chip erase operation are ignored. however, note that a hardware reset im- mediately terminates the erase operation. if that oc- curs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. figure 5 illustrates the algorithm for the erase opera- tion. refer to the erase and program operations ta- bles in the ac characteristics section for parameters, and figure 18 section for timing diagrams. sector erase command sequence sector erase is a six bus cycle operation. the sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. two ad- ditional unlock cycles are written, and are then fol- lowed by the address of the sector to be erased, and the sector erase command.table 14 shows the ad- dress and data requirements for the sector erase com- mand sequence. the device does not require the system to preprogram prior to erase. the embedded erase algorithm auto- matically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. the system is not required to provide any controls or tim- ings during these operations. after the command sequence is written, a sector erase time-out of 80 s occurs. during the time-out period, additional sector addresses and sector erase com- mands may be written. loading the sector erase buffer may be done in any sequence, and the number of sec- tors may be from one sector to all sectors. the time between these additional cycles must be less than 80 s, otherwise erasure may begin. any sector erase ad- dress and command following the exceeded time-out may or may not be accepted. it is recommended that processor interrupts be disabled during this time to en- sure all commands are accepted. the interrupts can be re-enabled after the last sector erase command is written. any command other than sector erase or erase suspend during the time-out period resets that bank to the read mode. the system must rewrite the command sequence and any additional addresses and commands. note that the secsi sector, autose- lect, and cfi functions are unavailable when an erase operation is in progress. the system can monitor dq3 to determine if the sec- tor erase timer has timed out (see the section on dq3: sector erase timer.). the time-out begins from the ris- ing edge of the final we# pulse in the command sequence. when the embedded erase algorithm is complete, the bank returns to reading array data and addresses are no longer latched. note that while the embedded erase operation is in progress, the system can read start write program command sequence data poll from system verify data? no yes last address? no yes programming completed increment address embedded program algorithm in progress note: see table 14 for program command sequence.
30 am49pdl640ag november 20, 2003 preliminary data from the non-erasing bank. the system can de- termine the status of the erase operation by reading dq7, dq6, dq2, or ry/by# in the erasing bank. refer to the write operation status section for information on these status bits. once the sector erase operation has begun, only the erase suspend command is valid. all other com- mands are ignored. however, note that a hardware reset immediately terminates the erase operation. if that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. figure 5 illustrates the algorithm for the erase opera- tion. refer to the erase and program operations ta- bles in the ac characteristics section for parameters, and figure 18 section for timing diagrams. erase suspend/erase resume commands the erase suspend command, b0h, allows the sys- tem to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. the bank address is required when writing this command. this command is valid only during the sector erase operation, including the 80 s time-out period during the sector erase command sequence. the erase suspend command is ignored if written dur- ing the chip erase operation or embedded program algorithm. when the erase suspend command is written during the sector erase operation, the device requires a max- imum of 20 s to suspend the erase operation. how- ever, when the erase suspend command is written during the sector erase time-out, the device immedi- ately terminates the time-out period and suspends the erase operation. addresses are ?don?t-cares? when writing the erase suspend command. after the erase operation has been suspended, the bank enters the erase-suspend-read mode. the sys- tem can read data from or program data to any sector not selected for erasure. (the device ?erase sus- pends? all sectors selected for erasure.) reading at any address within erase-suspended sectors pro- duces status information on dq7?dq0. the system can use dq7, or dq6 and dq2 together, to determine if a sector is actively erasing or is erase-suspended. refer to the write operation status section for infor- mation on these status bits. after an erase-suspended program operation is com- plete, the bank returns to the erase-suspend-read mode. the system can determine the status of the program operation using the dq7 or dq6 status bits, just as in the standard word program operation. refer to the write operation status section for more information. in the erase-suspend-read mode, the system can also issue the autoselect command sequence. the device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. when the device exits the au- toselect mode, the device reverts to the erase sus- pend mode, and is ready for another valid operation. refer to the autoselect mode and autoselect com- mand sequence sections for details. to resume the sector erase operation, the system must write the erase resume command (address bits are don?t care). the bank address of the erase-sus- pended bank is required when writing this command. further writes of the resume command are ignored. another erase suspend command can be written after the chip has resumed erasing. figure 5. erase operation password program command the password program command permits program- ming the password that is used as part of the hard- ware protection scheme. the actual password is 64-bits long. four password program commands are required to program the password. the system must enter the unlock cycle, password program command (38h) and the program address/data for each portion start write erase command sequence (notes 1, 2) data poll to erasing bank from system data = ffh? no yes erasure completed embedded erase algorithm in progress notes: 1. see table 14 for erase command sequence. 2. see the section on dq3 for information on the sector erase timer.
november 20, 2003 am49pdl640ag 31 preliminary of the password when programming. there are no pro- visions for entering the 2-cycle unlock cycle, the pass- word program command, and all the password data. there is no special addressing order required for pro- gramming the password. also, when the password is undergoing programming, simultaneous operation is disabled. read operations to any memory location will return the programming status. once programming is complete, the user must issue a read/reset com- mand to return the device to normal operation. once the password is written and verified, the password mode locking bit must be set in order to prevent verifi- cation. the password program command is only ca- pable of programming ?0?s. programming a ?1? after a cell is programmed as a ?0? results in a time-out by the embedded program algorithm? with the cell remain- ing as a ?0?. the password is all ones when shipped from the factory. all 64-bit password combinations are valid as a password. password verify command the password verify command is used to verify the password. the password is verifiable only when the password mode locking bit is not programmed. if the password mode locking bit is programmed and the user attempts to verify the password, the device will al- ways drive all f?s onto the dq data bus. the password verify command is permitted if the secsi sector is enabled. also, the device will not oper- ate in simultaneous operation when the password verify command is executed. only the password is re- turned regardless of the bank address. the lower two address bits (a1-a0) are valid during the password verify. writing the read/reset command returns the device back to normal operation. password protection mode locking bit program command the password protection mode locking bit program command programs the password protection mode locking bit, which prevents further verifies or updates to the password. once programmed, the password protection mode locking bit cannot be erased! if the password protection mode locking bit is verified as program without margin, the password protection mode locking bit program command can be executed to improve the program margin. once the password protection mode locking bit is programmed, the per- sistent sector protection locking bit program circuitry is disabled, thereby forcing the device to remain in the password protection mode. exiting the mode locking bit program command is accomplished by writing the read/reset command. persistent sector protection mode locking bit program command the persistent sector protection mode locking bit program command programs the persistent sector protection mode locking bit, which prevents the pass- word mode locking bit from ever being programmed. if the persistent sector protection mode locking bit is verified as programmed without margin, the persistent sector protection mode locking bit program com- mand should be reissued to improve program margin. by disabling the program circuitry of the password mode locking bit, the device is forced to remain in the persistent sector protection mode of operation, once this bit is set. exiting the persistent protection mode locking bit program command is accomplished by writing the read/reset command. secsi sector protection bit program command the secsi sector protection bit program command programs the secsi sector protection bit, which pre- vents the secsi sector memory from being cleared. if the secsi sector protection bit is verified as pro- grammed without margin, the secsi sector protection bit program command should be reissued to improve program margin. exiting the v cc -level secsi sector protection bit program command is accomplished by writing the read/reset command. ppb lock bit set command the ppb lock bit set command is used to set the ppb lock bit if it is cleared either at reset or if the password unlock command was successfully exe- cuted. there is no ppb lock bit clear command. once the ppb lock bit is set, it cannot be cleared un- less the device is taken through a power-on clear or the password unlock command is executed. upon set- ting the ppb lock bit, the ppbs are latched into the dybs. if the password mode locking bit is set, the ppb lock bit status is reflected as set, even after a power-on reset cycle. exiting the ppb lock bit set command is accomplished by writing the read/reset command (only in the persistent protection mode). dyb write command the dyb write command is used to set or clear a dyb for a given sector. the high order address bits (a21?a12) are issued at the same time as the code 01h or 00h on dq7-dq0. all other dq data bus pins are ignored during the data write cycle. the dybs are modifiable at any time, regardless of the state of the ppb or ppb lock bit. the dybs are cleared at power-up or hardware reset.exiting the dyb write command is accomplished by writing the read/reset command.
32 am49pdl640ag november 20, 2003 preliminary password unlock command the password unlock command is used to clear the ppb lock bit so that the ppbs can be unlocked for modification, thereby allowing the ppbs to become ac- cessible for modification. the exact password must be entered in order for the unlocking function to occur. this command cannot be issued any faster than 2 s at a time to prevent a hacker from running through all 64-bit combinations in an attempt to correctly match a password. if the command is issued before the 2 s execution window for each portion of the unlock, the command will be ignored. once the password unlock command is entered, the ry/by# indicates that the device is busy. approxi- mately 2 s is required for each portion of the unlock. once the first portion of the password unlock com- pletes (ry/by# is not low or dq6 does not toggle when read), the password unlock command and next part of the password are written. the system must thus monitor ry/by# or the status bits to confirm when to write the next portion of the password. note that immediately following successful unlock, write the secsi sector exit command before attempt- ing to verify, program, or erase the ppbs. ppb program command the ppb program command is used to program, or set, a given ppb. each ppb is individually pro- grammed (but is bulk erased with the other ppbs). the specific sector address (a21?a12) are written at the same time as the program command 60h with a6 = 0. if the ppb lock bit is set and the corresponding ppb is set for the sector, the ppb program command will not execute and the command will time-out without programming the ppb. after programming a ppb, two additional cycles are needed to determine whether the ppb has been pro- grammed with margin. if the ppb has been pro- grammed without margin, the program command should be reissued to improve the program margin. also note that the total number of ppb program/erase cycles is limited to 100 cycles. cycling the ppbs be- yond 100 cycles is not guaranteed. the ppb program command does not follow the em- bedded program algorithm. all ppb erase command the all ppb erase command is used to erase all ppbs in bulk. there is no means for individually eras- ing a specific ppb. unlike the ppb program, no spe- cific sector address is required. however, when the ppb erase command is written all sector ppbs are erased in parallel. if the ppb lock bit is set the all ppb erase command will not execute and the com- mand will time-out without erasing the ppbs. after erasing the ppbs, two additional cycles are needed to determine whether the ppb has been erased with margin. if the ppbs has been erased without margin, the erase command should be reissued to improve the program margin. it is the responsibility of the user to preprogram all ppbs prior to issuing the all ppb erase command. if the user attempts to erase a cleared ppb, over-era- sure may occur making it difficult to program the ppb at a later time. also note that the total number of ppb program/erase cycles is limited to 100 cycles. cycling the ppbs beyond 100 cycles is not guaranteed. dyb write command the dyb write command is used for setting the dyb, which is a volatile bit that is cleared at reset. there is one dyb per sector. if the ppb is set, the sector is pro- tected regardless of the value of the dyb. if the ppb is cleared, setting the dyb to a 1 protects the sector from programs or erases. since this is a volatile bit, remov- ing power or resetting the device will clear the dybs. the bank address is latched when the command is written. ppb lock bit set command the ppb lock bit set command is used for setting the dyb, which is a volatile bit that is cleared at reset. there is one dyb per sector. if the ppb is set, the sec- tor is protected regardless of the value of the dyb. if the ppb is cleared, setting the dyb to a 1 protects the sector from programs or erases. since this is a volatile bit, removing power or resetting the device will clear the dybs. the bank address is latched when the com- mand is written. ppb status command the programming of the ppb for a given sector can be verified by writing a ppb status verify command to the device. ppb lock bit status command the programming of the ppb lock bit for a given sec- tor can be verified by writing a ppb lock bit status ver- ify command to the device. note that immediately following the ppb lock status command write the secsi sector exit command be- fore attempting to verify, program, or erase the ppbs. sector protection status command the programming of either the ppb or dyb for a given sector or sector group can be verified by writing a sec- tor protection status command to the device. note that there is no single command to independently verify the programming of a dyb for a given sector group.
november 20, 2003 am49pdl640ag 33 preliminary command definitions tables legend: ba = address of bank switching to autoselect mode, bypass mode, or erase operation. determined by a21:a19, see tables 4 and 5 for more detail. pa = program address (a21:a0). addresses latch on falling edge of we# or ce# pulse, whichever happens later. pd = program data (dq15:dq0) written to location pa. data latches on rising edge of we# or ce# pulse, whichever happens first. ra = read address (a21:a0). rd = read data (dq15:dq0) from location ra. sa = sector address (a21:a12) for verifying (in autoselect mode) or erasing. wd = write data. see ?configuration register? definition for specific write data. data latched on rising edge of we#. x = don?t care notes: 1. see table 1 for description of bus operations. 2. all values are in hexadecimal. 3. shaded cells in table denote read cycles. all other cycles are write operations. 4. during unlock and command cycles, when lower address bits are 555 or 2aah as shown in table, address bits higher than a11 (except where ba is required) and data bits higher than dq7 are don?t cares. 5. no unlock or command cycles required when bank is reading array data. 6. the reset command is required to return to reading array (or to erase-suspend-read mode if previously in erase suspend) when bank is in autoselect mode, or if dq5 goes high (while bank is providing status information). 7. fourth cycle of autoselect command sequence is a read cycle. system must provide bank address to obtain manufacturer id or device id information. see autoselect command sequence section for more information. 8. the data is 80h for factory locked and 00h for not factory locked. 9. the data is 00h for an unprotected sector group and 01h for a protected sector group. 10. device id must be read across cycles 4, 5, and 6. 11. system may read and program in non-erasing sectors, or enter autoselect mode, when in program/erase suspend mode. program/erase suspend command is valid only during a sector erase operation, and requires bank address. 12. program/erase resume command is valid only during erase suspend mode, and requires bank address. 13. command is valid when device is ready to read array data or when device is in autoselect mode. 14. wp#/acc must be at v id during the entire operation of command. 15. unlock bypass entry command is required prior to any unlock bypass operation. unlock bypass reset command is required to return to the reading array. table 13. memory array command definitions command (notes) cycles bus cycles (notes 1?4) addr data addr data addr data addr data addr data addr data read (5) 1 ra rd reset (6) 1 xxx f0 autoselect (note 7) manufacturer id 4 555 aa 2aa 55 (ba) 555 90 (ba)x00 01 device id (10) 6 555 aa 2aa 55 (ba) 555 90 (ba)x01 7e (ba)x0e 15 (ba)x0f 01 secsi sector factory protect (8) 4 555 aa 2aa 55 (ba) 555 90 x03 (see note 8) sector group protect verify (9) 4 555 aa 2aa 55 (ba) 555 90 (sa)x02 xx00/ xx01 program 4 555 aa 2aa 55 555 a0 pa pd chip erase 6 555 aa 2aa 55 555 80 555 aa 2aa 55 555 10 sector erase 6 555 aa 2aa 55 555 80 555 aa 2aa 55 sa 30 program/erase suspend (11) 1 ba b0 program/erase resume (12) 1 ba 30 cfi query (13) 1 55 98 accelerated program (14) 2 xx a0 pa pd unlock bypass entry (15) 3 555 aa 2aa 55 555 20 unlock bypass program (15) 2 xx a0 pa pd unlock bypass erase (15) 2 xx 80 xx 10 unlock bypass cfi (13, 15) 1 xx 98 unlock bypass reset (15) 2 xx 90 xx 00
34 am49pdl640ag november 20, 2003 preliminary legend: dyb = dynamic protection bit ow = address (a6:a0) is (0011010) pd[3:0] = password data (1 of 4 portions) ppb = persistent protection bit pwa = password address. a1:a0 selects portion of password. pwd = password data being verified. pl = password protection mode lock address (a5:a0) is (001010) rd(0) = read data dq0 for protection indicator bit. rd(1) = read data dq1 for ppb lock status. sa = sector address where security command applies. address bits a21:a12 uniquely select any sector. sl = persistent protection mode lock address (a5:a0) is (010010) wp = ppb address (a6:a0) is (0111010) (note 16) ep = ppb erase address (a6:a0) is (1111010) (note 16) x = don?t care ppmlb = password protection mode locking bit spmlb = persistent protection mode locking bit 1. see table 1 for description of bus operations. 2. all values are in hexadecimal. 3. shaded cells in table denote read cycles. all other cycles are write operations. 4. during unlock and command cycles, when lower address bits are 555 or 2aah as shown in table, address bits higher than a11 (except where ba is required) and data bits higher than dq7 are don?t cares. 5. the reset command returns device to reading array. 6. cycle 4 programs the addressed locking bit. cycles 5 and 6 validate bit has been fully programmed when dq0 = 1. if dq0 = 0 in cycle 6, program command must be issued and verified again. 7. data is latched on the rising edge of we#. 8. entire command sequence must be entered for each portion of password. 9. command sequence returns ffh if ppmlb is set. 10. the password is written over four consecutive cycles, at addresses 0-3. 11. a 2 s timeout is required between any two portions of password. 12. a 100 s timeout is required between cycles 4 and 5. 13. a 1.2 ms timeout is required between cycles 4 and 5. 14. cycle 4 erases all ppbs. cycles 5 and 6 validate bits have been fully erased when dq0 = 0. if dq0 = 1 in cycle 6, erase command must be issued and verified again. before issuing erase command, all ppbs should be programmed to prevent ppb overerasure. 15. dq1 = 1 if ppb locked, 0 if unlocked. 16. for all other parts that use the persistent protection bit (excluding pdl128g), the wp and ep addresses are 00000010. 17. immediately following successful unlock, write the secsi sector exit command before attempting to verify, program, or erase the ppbs. 18. immediately following the ppb lock status command write the secsi sector exit command before attempting to verify, program, or erase the ppbs. table 14. sector protection command definitions command (notes) cycles bus cycles (notes 1-4) addr data addr data addr data addr data addr data addr data reset 1 xxx f0 secsi sector entry 3 555 aa 2aa 55 555 88 secsi sector exit 4 555 aa 2aa 55 555 90 xx 00 secsi protection bit program (5, 6) 6 555 aa 2aa 55 555 60 ow 68 ow 48 ow rd(0) secsi protection bit status 4 555 aa 2aa 55 555 60 ow rd(0) password program (5, 7, 8) 4 555 aa 2aa 55 555 38 xx[0-3] pd[0-3] password verify (8, 9) 4 555 aa 2aa 55 555 c8 pwa[0-3] pwd[0-3] password unlock (7, 10, 11, 17) 4 555 aa 2aa 55 555 28 pwa[0-3] pwd[0-3] ppb program (5, 6, 12) 6 555 aa 2aa 55 555 60 (sa)wp 68 (sa)wp 48 (sa)wp rd(0) all ppb erase (5, 13, 14) 6 555 aa 2aa 55 555 60 ep 60 (sa)ep 40 (sa)wp rd(0) ppb lock bit set 3 555 aa 2aa 55 555 78 ppb lock bit status (15, 18) 4 555 aa 2aa 55 555 58 sa rd(1) dyb write (7) 4 555 aa 2aa 55 555 48 sa x1 dyb erase (7) 4 555 aa 2aa 55 555 48 sa x0 dyb status 4 555 aa 2aa 55 555 58 sa rd(0) ppmlb program (5, 6, 12) 6 555 aa 2aa 55 555 60 pl 68 pl 48 pl rd(0) ppmlb status (5) 4 555 aa 2aa 55 555 60 pl rd(0) spmlb program (5, 6, 12) 6 555 aa 2aa 55 555 60 sl 68 sl 48 sl rd(0) spmlb status (5) 4 555 aa 2aa 55 555 60 sl rd(0)
november 20, 2003 am49pdl640ag 35 preliminary write operation status the device provides several bits to determine the status of a program or erase operation: dq2, dq3, dq5, dq6, and dq7. table 16 and the following subsections describe the function of these bits. dq7 and dq6 each offer a method for determining whether a program or erase operation is com- plete or in progress. the device also provides a hard- ware-based output signal, ry/by#, to determine whether an embedded program or erase operation is in progress or has been completed. dq7: data# polling the data# polling bit, dq7, indicates to the host system whether an embedded program or erase algorithm is in progress or completed, or whether a bank is in erase sus- pend. data# polling is valid after the rising edge of the final we# pulse in the command sequence. during the embedded program algorithm, the device out- puts on dq7 the complement of the datum programmed to dq7. this dq7 status also applies to programming during erase suspend. when the embedded program algorithm is complete, the device outputs the datum programmed to dq7. the system must provide the program address to read valid status information on dq7. if a program address falls within a protected sector, data# polling on dq7 is ac- tive for approximately 1 s, then that bank returns to the read mode. during the embedded erase algorithm, data# polling produces a ?0? on dq7. when the embedded erase algorithm is complete, or if the bank enters the erase suspend mode, data# polling produces a ?1? on dq7. the system must provide an address within any of the sectors selected for erasure to read valid status infor- mation on dq7. after an erase command sequence is written, if all sectors selected for erasing are protected, data# poll- ing on dq7 is active for approximately 100 s, then the bank returns to the read mode. if not all selected sec- tors are protected, the embedded erase algorithm erases the unprotected sectors, and ignores the se- lected sectors that are protected. however, if the sys- tem reads dq7 at an address within a protected sector, the status may not be valid. when the system detects dq7 has changed from the complement to true data, it can read valid data at dq15?dq0 on the following read cycles. just prior to the completion of an embedded program or erase op- eration, dq7 may change asynchronously with dq15?dq0 while output enable (oe#) is asserted low. that is, the device may change from providing status information to valid data on dq7. depending on when the system samples the dq7 output, it may read the status or valid data. even if the device has com- pleted the program or erase operation and dq7 has valid data, the data outputs on dq15?dq0 may be still invalid. valid data on dq15?dq0 will appear on suc- cessive read cycles. table 16 shows the outputs for data# polling on dq7. figure 6 shows the data# polling algorithm. figure 20 in the ac characteristics section shows the data# polling timing diagram. figure 6. data# polling algorithm dq7 = data? yes no no dq5 = 1? no yes yes fail pass read dq7?dq0 addr = va read dq7?dq0 addr = va dq7 = data? start notes: 1. va = valid address for programming. during a sector erase operation, a valid address is any sector address within the sector being erased. during chip erase, a valid address is any non-protected sector address. 2. dq7 should be rechecked even if dq5 = ?1? because dq7 may change simultaneously with dq5.
36 am49pdl640ag november 20, 2003 preliminary ry/by#: ready/busy# the ry/by# is a dedicated, open-drain output pin which indicates whether an embedded algorithm is in progress or complete. the ry/by# status is valid after the rising edge of the final we# pulse in the command sequence. since ry/by# is an open-drain output, sev- eral ry/by# pins can be tied together in parallel with a pull-up resistor to v cc . if the output is low (busy), the device is actively eras- ing or programming. (this includes programming in the erase suspend mode.) if the output is high (ready), the device is in the read mode, the standby mode, or one of the banks is in the erase-sus- pend-read mode. table 16 shows the outputs for ry/by#. dq6: toggle bit i toggle bit i on dq6 indicates whether an embedded program or erase algorithm is in progress or com- plete, or whether the device has entered the erase suspend mode. toggle bit i may be read at any ad- dress, and is valid after the rising edge of the final we# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. during an embedded program or erase algorithm op- eration, successive read cycles to any address cause dq6 to toggle. the system may use either oe# or ce# to control the read cycles. when the operation is complete, dq6 stops toggling. after an erase command sequence is written, if all sectors selected for erasing are protected, dq6 tog- gles for approximately 100 s, then returns to reading array data. if not all selected sectors are protected, the embedded erase algorithm erases the unprotected sectors, and ignores the selected sectors that are pro- tected. the system can use dq6 and dq2 together to deter- mine whether a sector is actively erasing or is erase-suspended. when the device is actively erasing (that is, the embedded erase algorithm is in progress), dq6 toggles. when the device enters the erase sus- pend mode, dq6 stops toggling. however, the system must also use dq2 to determine which sectors are erasing or erase-suspended. alternatively, the system can use dq7 (see the subsection on dq7: data# poll- ing). if a program address falls within a protected sector, dq6 toggles for approximately 1 s after the program command sequence is written, then returns to reading array data. dq6 also toggles during the erase-suspend-program mode, and stops toggling once the embedded pro- gram algorithm is complete. table 16 shows the outputs for toggle bit i on dq6. figure 7 shows the toggle bit algorithm. figure 21 in the ?flash ac characteristics? section shows the tog- gle bit timing diagrams. figure 22 shows the differ- ences between dq2 and dq6 in graphical form. see also the subsection on dq2: toggle bit ii. figure 7. toggle bit algorithm start no yes yes dq5 = 1? no yes toggle bit = toggle? no program/erase operation not complete, write reset command program/erase operation complete toggle bit = toggle? read byte twice (dq7?dq0) address = va read byte (dq7?dq0) address =va read byte (dq7?dq0) address =va note: the system should recheck the toggle bit even if dq5 = ?1? because the toggle bit may stop toggling as dq5 changes to ?1.? see the subsections on dq6 and dq2 for more information.
november 20, 2003 am49pdl640ag 37 preliminary dq2: toggle bit ii the ?toggle bit ii? on dq2, when used with dq6, indi- cates whether a particular sector is actively erasing (that is, the embedded erase algorithm is in progress), or whether that sector is erase-suspended. toggle bit ii is valid after the rising edge of the final we# pulse in the command sequence. dq2 toggles when the system reads at addresses within those sectors that have been selected for era- sure. (the system may use either oe# or ce# to con- trol the read cycles.) but dq2 cannot distinguish whether the sector is actively erasing or is erase-sus- pended. dq6, by comparison, indicates whether the device is actively erasing, or is in erase suspend, but cannot distinguish which sectors are selected for era- sure. thus, both status bits are required for sector and mode information. refer to table 16 to compare out- puts for dq2 and dq6. figure 7 shows the toggle bit algorithm in flowchart form, and the section ?dq2: toggle bit ii? explains the algorithm. see also the dq6: toggle bit i subsection. figure 21 shows the toggle bit timing diagram. figure 22 shows the differences between dq2 and dq6 in graphical form. reading toggle bits dq6/dq2 refer to figure 7 for the following discussion. when- ever the system initially begins reading toggle bit sta- tus, it must read dq15?dq0 at least twice in a row to determine whether a toggle bit is toggling. typically, the system would note and store the value of the tog- gle bit after the first read. after the second read, the system would compare the new value of the toggle bit with the first. if the toggle bit is not toggling, the device has completed the program or erase operation. the system can read array data on dq15?dq0 on the fol- lowing read cycle. however, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the sys- tem also should note whether the value of dq5 is high (see the section on dq5). if it is, the system should then determine again whether the toggle bit is tog- gling, since the toggle bit may have stopped toggling just as dq5 went high. if the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. if it is still toggling, the de- vice did not completed the operation successfully, and the system must write the reset command to return to reading array data. the remaining scenario is that the system initially de- termines that the toggle bit is toggling and dq5 has not gone high. the system may continue to monitor the toggle bit and dq5 through successive read cy- cles, determining the status as described in the previ- ous paragraph. alternatively, it may choose to perform other system tasks. in this case, the system must start at the beginning of the algorithm when it returns to de- termine the status of the operation (top of figure 7). dq5: exceeded timing limits dq5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. under these conditions dq5 produces a ?1,? indicating that the program or erase cycle was not successfully completed. the device may output a ?1? on dq5 if the system tries to program a ?1? to a location that was previously pro- grammed to ?0.? only an erase operation can change a ?0? back to a ?1.? under this condition, the device halts the operation, and when the timing limit has been exceeded, dq5 produces a ?1.? under both these conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previ- ously in the erase-suspend-program mode). dq3: sector erase timer after writing a sector erase command sequence, the system may read dq3 to determine whether or not erasure has begun. (the sector erase timer does not apply to the chip erase command.) if additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase com- mand. when the time-out period is complete, dq3 switches from a ?0? to a ?1.? if the time between addi- tional sector erase commands from the system can be assumed to be less than 50 s, the system need not monitor dq3. see also the sector erase command sequence section. after the sector erase command is written, the system should read the status of dq7 (data# polling) or dq6 (toggle bit i) to ensure that the device has accepted the command sequence, and then read dq3. if dq3 is ?1,? the embedded erase algorithm has begun; all fur- ther commands (except erase suspend) are ignored until the erase operation is complete. if dq3 is ?0,? the device will accept additional sector erase commands. to ensure the command has been accepted, the sys- tem software should check the status of dq3 prior to and following each subsequent sector erase com- mand. if dq3 is high on the second status check, the last command might not have been accepted. table 16 shows the status of dq3 relative to the other status bits.
38 am49pdl640ag november 20, 2003 preliminary table 15. write operation status notes: 1. dq5 switches to ?1? when an embedded program or embedded erase operation has exceeded the maximum timing limits. refer to the section on dq5 for more information. 2. dq7 and dq2 require a valid address when reading status information. refer to the appropriate subsection for further details. 3. when reading write operation status bits, the system must always provide the bank address where the embedded algorithm is in progress. the device outputs array data if the system addresses a non-busy bank. status dq7 (note 2) dq6 dq5 (note 1) dq3 dq2 (note 2) ry/by# standard mode embedded program algorithm dq7# toggle 0 n/a no toggle 0 embedded erase algorithm 0 toggle 0 1 toggle 0 erase suspend mode erase-suspend- read erase suspended sector 1 no toggle 0 n/a toggle 1 non-erase suspended sector data data data data data 1 erase-suspend-program dq7# toggle 0 n/a n/a 0
november 20, 2003 am49pdl640ag 39 preliminary psram power down note: for si-7 psram, deep power-down standby is not available. figure 8. state diagram table 16. standby mode characteristics power mode memory cell data standby current (a) wait time (s) standby valid 100 0 deep power down invalid 10 200 power up initial state (wait 200 s) active deep power down mode standby mode deep power down exit sequence power up sequence ce2 = v ih ce1# = v ih = or v il , ce2 = v ih ce2 = v il ce2 = v il ce2 = v ih , ce1# = v ih or ub#, lb# = v ih ce1# = v il , ce2 = v ih , ub# and lb# or/and lb# =v il
40 am49pdl640ag november 20, 2003 preliminary absolute maximum ratings storage temperature plastic packages . . . . . . . . . . . . . . . ?55 c to +125 c ambient temperature with power applied. . . . . . . . . . . . . . . ?25 c to +85 c voltage with respect to ground v cc (note 1) . . . . . . . . . . . . . . . . . ?0.5 v to +4.0 v reset# (note 2) . . . . . . . . . . . .?0.5 v to +12.5 v wp#/acc . . . . . . . . . . . . . . . . . . ?0.5 v to +10.5 v all other pins (note 1) . . . . . . ?0.5 v to v cc +0.5 v output short circuit current (note 3) . . . . . . 200 ma notes: 1. minimum dc voltage on input or i/o pins is ?0.5 v. during voltage transitions, input or i/o pins may overshoot v ss to ?2.0 v for periods of up to 20 ns. maximum dc voltage on input or i/o pins is v cc +0.5 v. see figure 9. during voltage transitions, input or i/o pins may overshoot to v cc +2.0 v for periods up to 20 ns. see figure 10. 2. minimum dc input voltage on pins reset#, and wp#/acc is ?0.5 v. during voltage transitions, wp#/acc, and reset# may overshoot v ss to ?2.0 v for periods of up to 20 ns. see figure 9. maximum dc input voltage on pin reset# is +12.5 v which may overshoot to +14.0 v for periods up to 20 ns. maximum dc input voltage on wp#/acc is +9.5 v which may overshoot to +12.0 v for periods up to 20 ns. 3. no more than one output may be shorted to ground at a time. duration of the short circuit should not be greater than one second. stresses above those listed under ?absolute maximum ratings? may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. figure 9. maximum negative overshoot waveform figure 10. maximum positive overshoot waveform operating ranges light industrial (l) devices ambient temperature (t a ) . . . . . . . . . ?25c to +85c v cc f/v cc s supply voltages v cc f/v cc s for standard voltage range . . 2.7 v to 3.1 v operating ranges define those limits between which the functionality of the device is guaranteed. 20 ns 20 ns +0.8 v ?0.5 v 20 ns ?2.0 v 20 ns 20 ns v cc +2.0 v v cc +0.5 v 20 ns 2.0 v
november 20, 2003 am49pdl640ag 41 preliminary dc characteristics cmos compatible notes: 1. the i cc current listed is typically less than 2 ma/mhz, with oe# at v ih . 2. maximum i cc specifications are tested with v cc = v ccmax . 3. i cc active while embedded erase or embedded program is in progress. 4. automatic sleep mode enables the low power mode when addresses remain stable for t acc + 30 ns. typical sleep mode current is 200 na. 5. not 100% tested. parameter symbol parameter description test conditions min typ max unit i li input load current v in = v ss to v cc , v cc = v cc max 1.0 a i lit reset# input load current v cc = v cc max ; v id = 12.5 v 35 a i lo output leakage current v out = v ss to v cc , oe# = v ih v cc = v cc max 1.0 a i cc1 v cc active read current (notes 1, 2) ce# = v il , oe# = v ih , v cc = v cc max 5 mhz 10 20 ma 10 mhz 25 45 i cc2 v cc active write current (notes 2, 3) ce# = v il , oe# = v ih , we# = v il 15 30 ma i cc3 v cc standby current (note 2) ce#, reset#, wp#/acc = v io 0.3 v 1 5 a i cc4 v cc reset current (note 2) reset# = v ss 0.3 v 1 5 a i cc5 automatic sleep mode (notes 2, 4) v ih = v io 0.3 v; v il = v ss 0.3 v 15a i cc6 v cc active read-while-program current (notes 1, 2) ce# = v il , oe# = v ih word 21 45 ma i cc7 v cc active read-while-erase current (notes 1, 2) ce# = v il , oe# = v ih word 21 45 ma i cc8 v cc active program-while-erase- suspended current (notes 2, 5) ce# = v il , oe# = v ih 17 35 ma v il input low voltage ?0.5 0.8 v v ih input high voltage 2 v cc +0.3 v v hh voltage for acc program acceleration v cc = 3.0 v 10% 8.5 9.5 v v id voltage for autoselect and temporary sector unprotect v cc = 3.0 v 10% 11.5 12.5 v v ol output low voltage i ol = 4.0 ma, v cc = v ccs 0.4 v v oh output high voltage i oh = ?100 a, v ccf = v ccs v io ?0.1 v i oh = ?2.0 ma, v cc = v ccs 2.4 v v lko low v cc lock-out voltage (note 5) 2.3 2.5 v
42 am49pdl640ag november 20, 2003 preliminary psram dc and operating characteristics (note 1) notes: 1. overshoot: vcc + 2.0 v in case of pulse width 20 ns. 2. undershoot: -2.0 v in case of pulse width 20 ns. 3. not 100% tested 4. for si-7 psram, deep power-down standby is not available. parameter symbol parameter description test conditions min typ max unit i li input leakage current v in = v ss to v cc ?1.0 1.0 a i lo output leakage current ce#1s = v ih , ce2s = v il or oe# = v ih or we# = v il , v io = v ss to v cc ?1.0 1.0 a i cc1 s operating current at minimum cycle time cycle time = min., 100% duty i io = 0 ma, ce#1 0.2 v, ce2 v dd -0.2 v, v in 0.2 v or v in v dd -0.2 v 30 i cc2 s operating current at maximum cycle time cycle time = 1 s, 100% duty i io = 0 ma, ce#1 = v il , ce2 = v ih , v in = v ih or v il 3 v il input low voltage ?0.2 (note 2) 0.6 v v ih input high voltage 2.2 v cc +0.2 (note 1) v v ol output low voltage i ol = 2.1 ma 0.4 v v oh output high voltage i oh = ?1.0 ma 2.4 v i sb standby current (ttl) ce#1s = v ih , ce2 = v il , other inputs = v ih or v il 0.3 ma i sb1 standby current (cmos) ce1# = v dd -0.2 v and ce2 = v dd -0.2 v, other inputs = v ss ~ v cc 100 a i sbd deep power down (note 4) ce2 0.2 v, other inputs = v ss ~ v cc 10 a
november 20, 2003 am49pdl640ag 43 preliminary test conditions table 17. test specifications key to switching waveforms 2.7 k ? c l 6.2 k ? 3.0 v device under te s t note: diodes are in3064 or equivalent figure 11. test setup test condition 70, 85 unit output load 1 ttl gate output load capacitance, c l (including jig capacitance) 30 pf input rise and fall times 5 ns input pulse levels 0.0?3.0 v input timing measurement reference levels 1.5 v output timing measurement reference levels 1.5 v ks000010-pal waveform inputs outputs steady changing from h to l changing from l to h don?t care, any change permitted changing, state unknown does not apply center line is high impedance state (high z) 3.0 v 0.0 v 1.5 v 1.5 v output measurement level input figure 12. input waveforms and measurement levels
44 am49pdl640ag november 20, 2003 preliminary ac characteristics psram ce#s timing figure 13. timing diagram for alternating between psram to flash parameter description test setup all speeds unit jedec std ?t ccr ce#s recover time ? min 0 ns ce# t ccr t ccr ce2#
november 20, 2003 am49pdl640ag 45 preliminary ac characteristics flash read-only operations notes: 1. not 100% tested. 2. see figure 11 and table 18 for test specifications 3. measurements performed by placing a 50 ohm termination on the data pin with a bias of v cc /2. the time from oe# high to the data bus driven to v cc /2 is taken as t df . . parameter description test setup speed options jedec std. 70 85 unit t avav t rc read cycle time (note 1) min 70 85 ns t avqv t acc address to output delay ce#, oe# = v il max 70 85 ns t elqv t ce chip enable to output delay oe# = v il max 70 85 ns t pac c page access time max 25 30 ns t glqv t oe output enable to output delay max 25 30 ns t ehqz t df chip enable to output high z (notes 1, 3) max 25 30 ns t ghqz t df output enable to output high z (notes 1, 3) max 25 30 ns t axqx t oh output hold time from addresses, ce# or oe#, whichever occurs first min 4 5 ns t oeh output enable hold time (note 1) read min 0 ns toggle and data# polling min 10 ns t oh t ce outputs we# addresses ce# oe# high z output valid high z addresses stable t rc t acc t oeh t rh t oe t rh 0 v ry/by# reset# t df figure 14. read operation timings
46 am49pdl640ag november 20, 2003 preliminary ac characteristics figure 15. page read operation timings a21 - a3 c e# or ce2# oe# a2 - a0 data same page aa ab ac ad qa qb qc qd t acc t pac c t pac c t pac c
november 20, 2003 am49pdl640ag 47 preliminary flash ac characteristics hardware reset (reset#) note: not 100% tested. parameter description all speed options unit jedec std t ready reset# pin low (during embedded algorithms) to read mode (see note) max 20 s t ready reset# pin low (not during embedded algorithms) to read mode (see note) max 500 ns t rp reset# pulse width min 500 ns t rh reset high time before read (see note) min 50 ns t rpd reset# low to standby mode min 20 s t rb ry/by# recovery time min 0 ns reset# ry/by# ry/by# t rp t ready reset timings not during embedded algorithms t ready ce#f, oe# t rh ce#f, oe# reset timings during embedded algorithms reset# t rp t rb figure 16. reset timings
48 am49pdl640ag november 20, 2003 preliminary ac characteristics flash erase and program operations notes: 1. not 100% tested. 2. see the ?deep power down mode? section for more information. parameter speed options jedec std description 70 85 unit t avav t wc write cycle time (note 1) min 70 85 ns t avwl t as address setup time min 0 ns t aso address setup time to oe# low during toggle bit polling min 15 ns t wlax t ah address hold time min 45 ns t aht address hold time from ce# or oe# high during toggle bit polling min 0 ns t dvwh t ds data setup time min 35 ns t whdx t dh data hold time min 0 ns t oeph output enable high during toggle bit polling min 20 ns t ghwl t ghwl read recovery time before write (oe# high to we# low) min 0 ns t elwl t cs ce# setup time min 0 ns t wheh t ch ce# hold time min 0 ns t wlwh t wp write pulse width min 35 ns t whdl t wph write pulse width high min 30 ns t sr/w latency between read and write operations min 0 ns t whwh1 t whwh1 programming operation (note 2) typ 6 s t whwh1 t whwh1 accelerated programming operation (note 2) typ 4 s t whwh2 t whwh2 sector erase operation (note 2) typ 0.2 sec t vcs v cc setup time (note 1) min 50 s t rb write recovery time from ry/by# min 0 ns t busy program/erase valid to ry/by# delay max 90 ns
november 20, 2003 am49pdl640ag 49 preliminary flash ac characteristics oe# we# ce#f v cc f data addresses t ds t ah t dh t wp pd t whwh1 t wc t as t wph t vcs 555h pa pa read status data (last two cycles) a0h t ghwl t cs status d out program command sequence (last two cycles) ry/by# t rb t busy t ch pa n otes: 1 . pa = program address, pd = program data, d out is the true data at the program address.. figure 17. program operation timings wp#/acc t vhh v hh v il or v ih v il or v ih t vhh figure 18. accelerated program timing diagram
50 am49pdl640ag november 20, 2003 preliminary flash ac characteristics oe# ce#f addresses v cc f we# data 2aah sadd t ghwl t ah t wp t wc t as t wph 555h for chip erase 10 for chip erase 30h t ds t vcs t cs t dh 55h t ch in progress complete t whwh2 va va erase command sequence (last two cycles) read status data ry/by# t rb t busy notes: 1. sadd = sector address (for sector erase), va = valid address for reading status data (see ?write operation status?). figure 19. chip/sector er ase operation timings
november 20, 2003 am49pdl640ag 51 preliminary flash ac characteristics oe# we# addresses t oh data valid in valid in valid pa valid ra t wc t wph t ah t wp t ds t dh t rc t ce valid out t oe t acc t oeh t ghwl t df valid in ce#f controlled write cycles we# controlled write cycle valid pa valid pa t cp t cph t wc t wc read cycle t sr/w ce#f figure 20. back-to-back read/write cycle timings we# ce#f oe# high z t oe high z dq7 dq6?dq0 ry/by# t busy complement tr u e addresses va t oeh t ce t ch t oh t df va va status data complement status data tr u e valid data valid data t acc t rc note: va = valid address. illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. figure 21. data# polling timings (during embedded algorithms)
52 am49pdl640ag november 20, 2003 preliminary flash ac characteristics oe# we# addresses t oeh t dh t aht t aso t oeph t oe valid data (first read) (second read) (stops toggling) t ceph t aht t as dq6/dq2 valid data valid status valid status valid status ry/by# ce#f note: va = valid address; not required for dq6. illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle. figure 22. toggle bit timings (during embedded algorithms) note: dq2 toggles only when read at an address within an erase-suspended sector. the system may use oe# or ce#f to toggle dq2 and dq6. figure 23. dq2 vs. dq6 enter erase erase erase enter erase suspend program erase suspend read erase suspend read erase we# dq6 dq2 erase complete erase suspend suspend program resume embedded erasing
november 20, 2003 am49pdl640ag 53 preliminary flash ac characteristics temporary sector unprotect note: not 100% tested. parameter all speed options jedec std description unit t vidr v id rise and fall time (see note) min 500 ns t vhh v hh rise and fall time (see note) min 250 ns t rsp reset# setup time for temporary sector unprotect min 4 s t rrb reset# hold time from ry/by# high for temporary sector unprotect min 4 s reset# t vidr v id v ss , v il , or v ih v id v ss , v il , or v ih ce#f we# ry/by# t vidr t rsp program or erase command sequence t rrb figure 24. temporary sector unprotect timing diagram
54 am49pdl640ag november 20, 2003 preliminary flash ac characteristics sector/sector block protect: 150 s, sector/sector block unprot ect: 15 ms 1 s reset# sadd, a6, a1, a0 data ce#f we# oe# 60h 60h 40h valid* valid* valid* status sector/sector block protect or unprotect verify v id v ih * for sector protect, a6 = 0, a1 = 1, a0 = 0. for sector unprotect, a6 = 1, a1 = 1, a0 = 0, sadd = sector address. figure 25. sector/sector block protect and unprotect timing diagram
november 20, 2003 am49pdl640ag 55 preliminary flash ac characteristics flash alternate ce#f controlled erase and program operations 1. not 100% tested. 2. see the ?deep power down mode? section for more information. parameter speed options jedec std. description 70 85 unit t avav t wc write cycle time (note 1) min 70 85 ns t avwl t as address setup time min 0 ns t elax t ah address hold time min 45 ns t dveh t ds data setup time min 35 ns t ehdx t dh data hold time min 0 ns t ghel t ghel read recovery time before write (oe# high to we# low) min 0 ns t wlel t ws we# setup time min 0 ns t ehwh t wh we# hold time min 0 ns t eleh t cp ce# pulse width min 35 ns t ehel t cph ce# pulse width high min 30 ns t whwh1 t whwh1 programming operation (note 2) ty p 6 s t whwh1 t whwh1 accelerated programming operation (note 2) typ 4 s t whwh2 t whwh2 sector erase operation (note 2) typ 0.2 sec
56 am49pdl640ag november 20, 2003 preliminary flash ac characteristics t ghel t ws oe# ce#f we# reset# t ds data t ah addresses t dh t cp dq7# d out t wc t as t cph pa data# polling a0 for program 55 for erase t rh t whwh1 or 2 ry/by# t wh pd for program 30 for sector erase 10 for chip erase 555 for program 2aa for erase pa for program sadd for sector erase 555 for chip erase t busy notes: 1. figure indicates last two bus cycles of a program or erase operation. 2. pa = program address, sadd = sector address, pd = program data. 3. dq7# is the complement of the data written to the device. d out is the data written to the device.. figure 26. flash alternate ce#f controlled write (erase/program) operation timings
november 20, 2003 am49pdl640ag 57 preliminary psram ac characteristics power up time (etron psram only) figure 27. power up v ccs slew rate (etron psram only) notes: 1. at any time during power up, the v ccs slew rate (i.e. rate of change) must not exceed 58 v/ms (alternately, it must exceed 17 s/v). 2. power up and slew rate requirements apply to etron psram only. figure 28. v ccs slew rate ~ ~ 200 s ce#1s ce2s v cc s dv/dt 58 v/ms v ccs t 0
58 am49pdl640ag november 20, 2003 preliminary psram read cycle parameter symbol description speed unit 70 85 t rc read cycle time min 70 85 ns t aa address access time max 70 85 ns t co1 , t co2 chip enable to output max 70 85 ns t oe output enable access time max 35 40 ns t ba lb#s, ub#s to access time max 70 85 ns t lz12 chip enable low to low-z output min 10 ns t blz ub#, lb# enable to low-z output min 10 ns t olz output enable to low-z output min 5 ns t hz1 chip disable to high-z output max 25 35 ns t bhz ub#s, lb#s disable to high-z output max 25 35 ns t ohz output disable to high-z output max 25 35 ns t oh output data hold from address change min 10 ns
november 20, 2003 am49pdl640ag 59 preliminary psram ac characteristics read cycle note: 1. ce1# = oe# = v il , ce2 = we# = v ih , ub# or/and lb# = v il figure 29. psram read cycle?address controlled note: 1. ce2 = we# = v ih figure 30. psram read cycle?cs1# controlled read cycle 1-addressed controlled address t rc t oh t aa t oh previous data valid data valid data out addr ess data out ce 1# ub#, lb# oe# high-z high-z data valid t rc t aa t co t lz t oh t hz t bhz t ohz t olz t oe t blz t ba
60 am49pdl640ag november 20, 2003 preliminary psram ac characteristics write cycle parameter symbol description speed unit 70 85 t wc write cycle time min 70 85 ns t cw chip enable to end of write min 60 70 ns t as address setup time min 0 ns t aw address valid to end of write min 60 70 ns t bw ub#s, lb#s to end of write min 60 70 ns t wp write pulse time min 50 60 ns t wr write recovery time min 0 ns t whz write to output high-z min 0 ns max 20 30 t dw data to write time overlap min 30 30 ns t dh data hold from write time min 0 ns t ow end write to output low-z min 5 ns
november 20, 2003 am49pdl640ag 61 preliminary psram ac characteristics note: 1. ce2s = v ih 2. ce2s = we# = v ih figure 31. psram write cycle?we# controlled note: 1. ce2s = v ih 2. ce2s = we# = v ih figure 32. psram write cycle?cs1# controlled addr ess data in ce#1s ub#, lb# we# high-z high-z data valid data undefined data out t wc t aw t wr t cw t bw t wp t as t dw t dh t whz t ow addr ess data in ce#1s ub#, lb# we# data valid data out high-z t wc t aw t as t wr t cw t bw t wp t dw t dh
62 am49pdl640ag november 20, 2003 preliminary psram ac characteristics note: 1. ce2s = v ih 2. ce2s = we# = v ih figure 33. psram write cycle?ub#, lb# controlled figure 34. deep power down mode addr ess data in ce#1s ub#, lb# we# data valid data out high-z t wc t aw t wr t cw t bw t as t wp t dw t dh normal operation 1 s ~ ~ ~ ~ normal operation suspend 200 s wake up deep power down mode ce2s mode ce#1s
november 20, 2003 am49pdl640ag 63 preliminary psram ac characteristics note: applies to etron psram only. figure 35. abnormal timing note: applies to etron psram only. figure 36. avoidable timing 1 note: applies to etron psram only. figure 37. avoidable timing 2 15 s < t rc ce1# we # address 15 s ce1# we# t rc address < t rc 15 s t rc ce1# we# address
64 am49pdl640ag november 20, 2003 preliminary erase and programming performance notes: 1. typical program and erase times assume the following conditions: 25 c, 3.0 v v cc , 1,000,000 cycles. additionally, programming typicals assume checkerboard pattern. 2. under worst case conditions of 90 c, v cc = 2.7 v, 1,000,000 cycles. 3. the typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. in the pre-programming step of the embedded erase algorithm, all bytes are programmed to 00h before erasure. 5. system-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. see tables table 14 for further information on command definitions. 6. the device has a minimum erase and program cycle endurance of 1,000,000 cycles. latchup characteristics note: includes all pins except v cc . test conditions: v cc = 3.0 v, one pin at a time. package pin capacitance notes: 1. sampled, not 100% tested. 2. test conditions t a = 25c, f = 1.0 mhz. flash data retention parameter typ (note 1) max (note 2) unit comments sector erase time 0.4 5 sec excludes 00h programming prior to erasure (note 4) chip erase time 56 sec word program time 7 210 s excludes system level overhead (note 5) accelerated word program time 4 120 s chip program time (note 3) 28 84 sec description min max input voltage with respect to v ss on all pins except i/o pins (including reset#) ?1.0 v 13 v input voltage with respect to v ss on all i/o pins ?1.0 v v cc + 1.0 v v cc current ?100 ma +100 ma parameter symbol parameter description test setup typ max unit c in input capacitance v in = 0 11 14 pf c out output capacitance v out = 0 12 16 pf c in2 control pin capacitance v in = 0 14 16 pf c in3 wp#/acc pin capacitance v in = 0 17 20 pf parameter description test conditions min unit minimum pattern data retention time 150 c10years 125 c20years
november 20, 2003 am49pdl640ag 65 preliminary physical dimensions flk073?73-ball fine-pitch grid array 13 x 9 mm 3278 \ 16-038.14c package flk 073 jedec n/a 13.00 mm x 9.00 mm package symbol min nom max note a --- --- 1.40 profile a1 0.25 --- --- ball height a2 0.98 --- 1.08 body thickness d 13.00 bsc. body size e 9.00 bsc. body size d1 8.80 bsc. matrix footprint e1 7.20 bsc. matrix footprint md 12 matrix size d direction me 10 matrix size e direction n 72 ball count b 0.30 0.35 0.40 ball diameter ee 0.80 bsc. ball pitch ed 0.80 bsc ball pitch sd / se 0.40 bsc. solder ball placement a2,a3,a4,a5,a6,a7,a8,a9, b2,b3,b4,b7,b8,b9 c2,c9,c10,d1,d10,e1,e10, f5,f6,g5,g6,h1,h10 depopulated solder balls j1,j10,k1,k2,k9,k10, l2,l3,l4,l7,l8,l9 m2,m3,m4,m5,m6,m7,m8,m9 notes: 1. dimensioning and tolerancing methods per asme y14.5m-1994. 2. all dimensions are in millimeters. 3. ball position designation per jesd 95-1, spp-010. 4. e represents the solder ball grid pitch. 5. symbol "md" is the ball matrix size in the "d" direction. symbol "me" is the ball matrix size in the "e" direction. n is the number of populted solder ball positions for matrix size md x me. 6 dimension "b" is measured at the maximum ball diameter in a plane parallel to datum c. 7 sd and se are measured with respect to datums a and b and define the position of the center solder ball in the outer row. when there is an odd number of solder balls in the outer row sd or se = 0.000. when there is an even number of solder balls in the outer row, sd or se = e/2 8. "+" indicates the theoretical center of depopulated balls. 9. n/a 10 a1 corner to be identified by chamfer, laser or ink mark, metallized mark indentation or other means. 10 index mark 73x c 0.15 (2x) (2x) c 0.15 b a 6 b 0.20 c c 0.15 0.08 a cb m c m d e pin a1 c top view side view corner a2 a1 a 0.08 l m ed corner e1 7 se d1 a b dc e f hg 10 8 9 7 5 6 4 2 3 j k 1 ee sd bottom view pin a1 7
66 am49pdl640ag november 20, 2003 preliminary revision summary revision a (february 21, 2003) initial release revision a+1 (march 14, 2003) ordering information corrected typo in temperature range. revision a+2 (april 4, 2003) ordering information corrected typo in temperature range. corrected opns revision a+3 (april 7, 2003) ordering information corrected typo in temperature range. revision a+4 (august 5, 2003) figure 28. v ccs slew rate added figure. revision a+5 (november 20, 2003) distinctive characteristics, pseudo sram features added bullet regarding psram vendors. ordering information added si-7 psram option. device bus operations added note 10. psram power down added note. psram dc and operating characteristics added note 4. psram ac characteristics added note to diagrams. trademarks copyright ? 2003 advanced micro devices, inc. all rights reserved. amd, the amd logo, and combinations thereof are r egistered trademarks of advanced micro devices, inc. expressflash is a trademark of advanced micro devices, inc. product names used in this publication are for identification pur poses only and may be trademarks of their respective companies .

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